Inelastic Scattering and Secondary Electron Emission under Resonance Conditions in RHEED from Pt(111)

  • H. Marten
Part of the NATO ASI Series book series (NSSB, volume 188)


The discovery of scattering resonances in Reflection High Energy Electron Diffraction (RHEED) dates back to 1933 when Kikuchi and Nakagawa [1] observed an anomalous enhancement of diffraction intensities from ZnS under certain experimental conditions. Miyake et al. [2] recognized these conditions to be fulfilled whenever a diffracted beam, just before emergence from the crystal, is propagating nearly parallel to the surface. Kohra et al. [3] showed that this situation corresponds to the existence of an intense wavefield at the surface of the crystal which is stationary and strongly damped into the crystal. Miyake and Hayakawa [4] were the first who suggested that the effect is based on a resonant scattering process (involving a surface state of the crystal). Many references have been made to this paper using terms such as “surface state resonance”, “surface wave resonance” or “surface resonance” to denote the effect. However, the origin and nature of the resonant states concerned have been clarified only recently. With the aid of model calculations based on a multislice formulation of the RHEED theory [5] it has been shown that these states correspond to the intrinsic bound states in the scattering potential of an atomic monolayer [6,7].


Inelastic Scattering Reflection High Energy Electron Diffraction Secondary Electron Emission Emission Yield Reflection High Energy Electron Diffraction Pattern 


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    S. Kikuchi and S. Nakagawa, Sci. Papers Inst. Phys. Chem. Res. Tokyo, 21:256 (1933).Google Scholar
  2. 2.
    S. Miyake, K. Kohra and M. Tagaki, Acta Cryst., 7:393 (1954).CrossRefGoogle Scholar
  3. 3.
    K. Kohra, K. Molière, S. Nakano and M. Ariyama, J. Phys. Soc. Japan., Suppl. BII, 17:82 (1962).Google Scholar
  4. 4.
    S. Miyake and K. Hayakawa, Acta Cryst., A26:60 (1970).Google Scholar
  5. 5.
    P. A. Maksym and J. L. Beeby, Surface Sci., 110:423 (1981).ADSCrossRefGoogle Scholar
  6. 6.
    P. A. Maksym and J. L. Beeby, Appl. Surface Sci., 11/12:663 (1982).Google Scholar
  7. 7.
    H. Marten and G. Meyer-Ehmsen, Surface Sci., 151:570 (1985).ADSCrossRefGoogle Scholar
  8. 8.
    G. Lehmpfuhl and W. C. T. Dowell, Acta Cryst., A42:569 (1986).Google Scholar
  9. 9.
    Y. Uchida, J. Jäger and G. Lehmpfuhl, Ultramicroscopy, 13:325 (1984).CrossRefGoogle Scholar
  10. 10.
    A. Ichimiya and Y. Takeuchi, Surface Sci., 128:343 (1983).ADSCrossRefGoogle Scholar
  11. 11.
    Y. Horio and A. Ichimiya, Surface Sci., 164:589 (1985).ADSCrossRefGoogle Scholar
  12. 12.
    K. Britze and G. Meyer-Ehmsen, Surface Sci., 77:131 (1978).ADSCrossRefGoogle Scholar
  13. 13.
    G. Meyer-Ehmsen, this volume, 99 (1988).Google Scholar

Copyright information

© Plenum Press, New York 1988

Authors and Affiliations

  • H. Marten
    • 1
  1. 1.Fachbereich PhysikUniversität OsnabrückOsnabrückGermany

Personalised recommendations