Abstract
Reflection high energy electron diffraction (RHEED) is one of the most powerful techniques for structural analysis of surfaces as described by Ino in these proceedings [1]. Several structures have been analyzed such as cleaved MgO(001) [2,3] and hydrogen stabilized Si(001)-1 × 1 surface [4]. In RHEED, the electron beam is incident on the surface at a very small angle. For this particular geometrical condition, the RHEED intensity is quite sensitive to the surface roughness like point defects and steps, which are often present on real surfaces.
Keywords
- Step Edge
- Reflection High Energy Electron Diffraction
- Molecular Beam Epitaxy Growth
- Intensity Oscillation
- Order Beam
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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© 1988 Plenum Press, New York
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Kawamura, T. (1988). Calculation of Rheed Intensity from Growing Surfaces. In: Larsen, P.K., Dobson, P.J. (eds) Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces. NATO ASI Series, vol 188. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-5580-9_36
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DOI: https://doi.org/10.1007/978-1-4684-5580-9_36
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