Application of Reflection Electron Microscopy for Surface Science (Observation of Cleaned Crystal Surfaces of Si, Pt, Au and Ag)

  • Yuji Uchida
Part of the NATO ASI Series book series (NSSB, volume 188)


The contribution of the electron microscope to surface science was relatively small compared to its large capability for obtaining direct information of the structure of specimens. The reason for this might be mainly due to the poor vacuum of the usual commercial electron microscope. It has been shown that one could obtain splendid results from surface investigations when an ultra-high-vacuum (UHV) electron microscope was used [1–6] and that many interesting results on crystal surfaces could be obtained even by using a conventional electron microscope[7–10]. In the latter case, however, the results might be influenced by the insufficient vacuum during the observation of the specimens in the electron microscope.


Crystal Surface Cylindrical Surface Atomic Step Terrace Surface Conventional Electron Microscope 
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Copyright information

© Plenum Press, New York 1988

Authors and Affiliations

  • Yuji Uchida
    • 1
  1. 1.Fritz-Haber-Institut der Max-Planck-GesellschaftBerlin 33Germany

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