Reflection Electron Microscopy with Use of CTEM: Studies of Au Growth on Pt(111)

  • K. Yagi
  • S. Ogawa
  • Y. Tanishiro
Part of the NATO ASI Series book series (NSSB, volume 188)


Reflection electron microscopy (REM) and reflection high energy electron diffration (RHEED) in ultra-high vacuum (UHV) conditions have been found to be very powerful methods for the studies of surface structures and surface dynamic processes on bulk crystals, although REM images are foreshortened and the resolution is limited to some extent. The history of REM and its characteristics have been recently reviewed by one of the present authors [K.Y.][1] and are described in this book by many authors. Therefore, in this paper, we briefly review the characteristics of REM-RHEED with the use of conventional transmission electron microscopes (CTEM) and illustrate them by a recent study of growth of Au on Pt(111) surfaces. Scanning REM using a small scanning probe and a small solid angle detector (Cowley, Ichikawa and Doi, Bennett and Johnson in this book) which is equivalent by reciprocity theory to REM using a CTEM is not described.


Chromatic Aberration Electron Energy Loss Spectrum Conventional Transmission Electron Microscope Monolayer Island Specular Beam 
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Copyright information

© Plenum Press, New York 1988

Authors and Affiliations

  • K. Yagi
    • 1
  • S. Ogawa
    • 1
  • Y. Tanishiro
    • 1
  1. 1.Physics DepartmentTokyo Institute of TechnologyTokyo 152Japan

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