Abstract
This paper is concerned with the diffraction of electrons of high energy at near grazing incidence onto the surface of a crystalline specimen. This is the situation normally known as RHEED (reflection high energy electron diffration). However, it particularly addresses the case when the illumination is focused to a small spot on the specimen, with a convergence angle that is comparable with the Bragg angle. It is not normally possible to achieve this in a traditional RHEED apparatus fitted, say, to a UHV epitaxy system and the experiments referred to here will normally be performed in a transmission electron microscope.
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© 1988 Plenum Press, New York
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Eades, J.A., Shannon, M.D. (1988). Surface Convergent-Beam Diffraction for Characterization and Symmetry Determination. In: Larsen, P.K., Dobson, P.J. (eds) Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces. NATO ASI Series, vol 188. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-5580-9_18
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DOI: https://doi.org/10.1007/978-1-4684-5580-9_18
Publisher Name: Springer, Boston, MA
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