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Brightness Limits for Ion Sources

  • Roderich Keller
Part of the NATO ASI Series book series (NSSB, volume 178)

Abstract

The status of high-current sources for ions from gaseous elements has by now reached quite satisfactory levels of reliability, and several basic source types are available that offer good results, see Keller (1985). Processing of materials with low vapor pressure or of corrosive gases still exhibits its inherent difficulties, but also in this area considerable progresses have been achieved, using two-gas techniques as did Shubaly et al. (1985) or hot running sources with internal oven or external supply as described by Keller et al. (1986). In consequence, it seems that the main brightness-limiting factor for ion beams as they are created by the sources is not so much determined by the plasma generator itself but rather by the extraction system used to actually form the beam.

Keywords

Extraction System Emittance Pattern Beam Formation Extraction Voltage Absolute Emittance 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. Boers, J. E., 1979, SNOW, a Digital Computer Program for the Simulation of Ion Beam Devices, Sandia Nat. Lab. report SAND 79–1027.Google Scholar
  2. Brown, I. G., Galvin, J. E., and MacGill, R. A., 1985, High Current Ion Source, Appl. Phys. Letters, 47:358.ADSCrossRefGoogle Scholar
  3. Coupland, J. R., Green, T. S., Hammond, D. P., and Riviere, A. C., 1973, A Study of the Ion Beam Intensity and Divergence Obtained from a Single Aperture Three Electrode Extraction System, Rev. Sci. Instr., 44:1258.ADSCrossRefGoogle Scholar
  4. Keller, R., 1982, Ion Sources and Low Energy Beam Transport, Proc Symp. on Accelerator Aspects of Heavy Ion Fusion, GSI Darmstadt report GSI-82–8:87.Google Scholar
  5. Keller, R., Spädtke, P., and Hofmann, K., 1983, Optimization of a Single-Aperture Extraction System for High-Current Ion Sources, Springer Series in Electrophys, 11:69.Google Scholar
  6. Keller, R., 1985, High-brightness, high-current ion sources, Proc. Workshop on High Current, High Brightness, and High Duty Factor Injectors, San Diego. Published as American Inst. Phys. Conf. Proc. (1986).Google Scholar
  7. Keller, R., Sherman, J. D., and Allison, P., 1985, Use of a Minimum Ellipse Criterion in the Study of Ion Beam Extraction Systems, IEEE Trans. Nucl. Sci., 32:2579.ADSCrossRefGoogle Scholar
  8. Keller, R., 1986, Innovations in Ion Sources and Injectors, Proc. 1986 Linac Conf., SLAC Stanford.Google Scholar
  9. Keller, R., Spädtke, P., and Emig, H., 1986, Recent Results with a High-Current, Heavy-Ion Source System, Proc. 4th Conf. on Low Energy Ion Beams, Brighton. To be publ. in Vacuum TAIP.Google Scholar
  10. Kilpatrick, W. D., 1957, Criterion for Vacuum Sparking Designed to Include Both RF and DC, Rev. Sci. Instr., 28:824.ADSCrossRefGoogle Scholar
  11. Langmuir, I., 1929, The Interaction of Electron and Positive Ion Space Charges in Cathode Sheaths, Phys. Rev., 33:954.ADSCrossRefGoogle Scholar
  12. Piosczyk, B., 1982, Preaccelerator Design and Component Development for the SNQ Linear Accelerator, Proc. 1981 Linac Conf., Santa Fe, Los Alamos Nat. Lab. report LA-9234-C.Google Scholar
  13. Prelec, K., 1986, Progress in the Development of H- Ion Sources, Proc. 1986 Linac Conf., SLAC Stanford.Google Scholar
  14. Schneider, J. D., Rutkowski, H. L., Meyer, E. A., Armstrong, D. D., Sherwood, B. A., and Catlin, L. L., 1979, Development of a High-Current Deuteron Injector for the FMIT Facility, Proc. 1979 Linac Conf. Brookhaven Nat. Lab. report BNL-51134:457.Google Scholar
  15. Shubaly, M. R., Maggs, R. G., and Weeden, A. E., 1985, A High-Current Oxygen Ion Source, IEEE Trans Nucl. Sci., 32:1751.ADSCrossRefGoogle Scholar
  16. Smith, H. V. Jr., Allison, P., and Sherman, J. D., 1985, The 4x Source, IEEE Trans. Nucl. Sci., 32:1797.ADSCrossRefGoogle Scholar
  17. Spädtke, P., 1983, AXCEL-GSI, GSI Darmstadt report GSI-83–9.Google Scholar
  18. Stevens, R. R., York, R. L., McConnell, J. R., and Kandarian, R., 1984, Status of the New High-Intensity H- Injector at LAMPF, Proc. 1984 Linac Conf., GSI Darmstadt report GSI-84–11:226.Google Scholar
  19. Takagi, T., ed. 1983, Proc. Int. Ion Engineering Congress, KyotoGoogle Scholar
  20. Whitson, J. C, Smith, J., and Whealton, J. H., 1978, Calculations Involving an Ion Beam Source, J. Comput. Phys., 28:408.MathSciNetADSMATHCrossRefGoogle Scholar

Copyright information

© Plenum Press, New York 1988

Authors and Affiliations

  • Roderich Keller
    • 1
  1. 1.Gesellschaft für SchwerionenforschungGSIDarmstadtWest Germany

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