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The Trace Element Analysis Facility at the University of Montreal

  • P. F. Hinrichsen
  • A. Houdayer
  • A. Belhadfa

Abstract

The design and performance of a PIXE (Proton Induced X-ray Emission) facility for trace element analysis is presented, with emphasis on those features which enhance the throughput and sensitivity, and minimize the cost per sample.

Keywords

Proton Beam Rutherford Back Scattering Elastic Recoil Detection Pulse Pileup PIXE Spectrum 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Resume

Le montage expérimental ainsi que les performances obtenues à l’aide d’une installation PIXE (Proton Induced X-ray Emission) pour l’analyse quantitative des éléments-traces sont décrits. L’accent est mis sur les charactéristiques qui augmentent le taux de production ainsi que la sensibilité tout en minimisant le coût d’analyse par échantillon.

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References

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Copyright information

© Plenum Press, New York 1987

Authors and Affiliations

  • P. F. Hinrichsen
    • 1
  • A. Houdayer
    • 1
  • A. Belhadfa
    • 1
  1. 1.Laboratoire de Physique NucléaireUniversité de MontréalMontréalCanada

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