Abstract
In this paper the theoretical study and experimental work to improve the ability of flaw identification in an ALOK imaging system are presented. After flaws have reliably been detected by TTLC method, the migration imaging can be executed with lesser computation time only for a determined small space. Then two methods, ALC method and instantaneous phase correlations, are introduced to decide the features of pattern recognition. The experimental results of two kinds of artificial defects, holes and cracks, show that the improvement on flaw identification has been obtained.
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References
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© 1987 Plenum Press, New York
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Wei, Y., Zhao, Xq. (1987). Flaw Identification in ALOK Imaging Systems. In: Jones, H.W. (eds) Proceedings of the Fifteenth International Symposium, July 14–6, 1986. Acoustical Imaging, vol 15. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-5320-1_24
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DOI: https://doi.org/10.1007/978-1-4684-5320-1_24
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4684-5322-5
Online ISBN: 978-1-4684-5320-1
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