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Determination of Residual Stress from Two-Dimensional Diffraction Patterns

  • Giancarlo M. Borgonovi

Abstract

The need for a reliable nondestructive technique for measuring residual stress, especially for field applications, is emphasized by the number of physical properties and effects which have been investigated as possible indications of residual stress. Most of these properties and effects correlate well with stress, but depend strongly on the microstructure of the material and require, to be useful, a good characterization of the material. Of the methods used for determining residual stress, x-ray diffraction has some distinct advantages. It is reliable and it has been long established. One limitation of the technique is that it provides surface stress measurements only, however this limitation is largely offset by the present capabilities of correlating, through calculations, the surface stresses to the bulk stresses.

Keywords

Residual Stress Stress Component Diffraction Ring Detector Plane Reciprocal Lattice Vector 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    M. James and J. B. Cohen, “PARS — A Portable X-Ray Analyzer for Residual Stresses”, Journal of Testing and Evaluation, 6, 91, 1978.CrossRefGoogle Scholar
  2. 2.
    C. O. Ruud and C. S. Barrett, “Use of Cr K-Beta X-Rays and a Position Sensitive Detector for Residual Stress Measurement in Stainless Steel Pipe”, Advances in X-Ray Analysis, Vol. 22, 247, 1979.Google Scholar
  3. 3.
    G. Borgonovi, D. Epperson, G. Houghton and J. Orphan, “Technical Feasibility of a Borehole Probe for In-Situ X-Ray Diffraction Analysis”, Advances in X-Ray Analysis, Vol. 24, 197, 1981.Google Scholar

Copyright information

© Plenum Press, New York 1984

Authors and Affiliations

  • Giancarlo M. Borgonovi
    • 1
  1. 1.Science Applications, IncLa JollaUSA

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