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Atom-Probe Microanalysis of WC-Co Based Cemented Carbides

  • M. Hellsing
  • A. Henjered
  • H. Nordén
  • H-O. Andrén

Abstract

Our understanding of the microstructure and microchemistry of metallic materials has increased dramatically during the last few decades, as modern methods of high resolution microscopy and microanalysis have successively become available. The transmission electron microscope (TEM), the electron microprobe, the scanning electron microscope (SEM) and, more recently, the “analytical electron microscope” (i.e. a scanning transmission electron microscope equipped with an energy dispersive X-ray spectrometer, STEM/EDS) have all produced a wealth of new knowledge and understanding. However, the science of hard metals has probably gained less from these methods than have other branches of metallurgy. This is no doubt due to the difficulty to prepare, from the hard metal materials, the thin foils that are a prerequisite for the study by the high-resolution methods, TEM and STEM/EDS. Electropolishing of materials containing phases as chemically different as refractory carbides and a soft binder phase is very dif f icult1–4, and ion etching is very time consuming5,6.

Keywords

Chemical Vapour Deposition Tungsten Carbide Titanium Carbide Scanning Transmission Electron Microscope Hard Metal 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1983

Authors and Affiliations

  • M. Hellsing
    • 1
  • A. Henjered
    • 1
  • H. Nordén
    • 1
  • H-O. Andrén
    • 1
  1. 1.Department of PhysicsChalmers University of TechnologyGothenburgSweden

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