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Characterization of Surfaces

  • H. K. Herglotz
Part of the Sagamore Army Materials Research Conference Proceedings book series (SAMC, volume 26)

Abstract

It is less than two decades since methods became available which truly deserve the predicate “Surface Characterization.” We owe this progress to advances in electronics which allow the detection of signals emerging from layers of minute thickness less than 100Å. A knowledge of the compositional and geometrical features of the surface help to devise processes for improved surface performance and properties, which is the theme of this book. This discussion will review classical methods, recent progress in surface characterization, as well as the desires of researchers for further advances.

Keywords

Auger Electron Electron Spectroscopy Attenuate Total Reflection Surface Characterization Auger Spectroscopy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1982

Authors and Affiliations

  • H. K. Herglotz
    • 1
  1. 1.Engineering Research and Development Division Experimental StationE. I. du Pont de Nemours and CompanyUSA

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