Characterization of Surfaces

  • H. K. Herglotz
Part of the Sagamore Army Materials Research Conference Proceedings book series (SAMC, volume 26)


It is less than two decades since methods became available which truly deserve the predicate “Surface Characterization.” We owe this progress to advances in electronics which allow the detection of signals emerging from layers of minute thickness less than 100Å. A knowledge of the compositional and geometrical features of the surface help to devise processes for improved surface performance and properties, which is the theme of this book. This discussion will review classical methods, recent progress in surface characterization, as well as the desires of researchers for further advances.


Auger Electron Electron Spectroscopy Attenuate Total Reflection Surface Characterization Auger Spectroscopy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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  1. 1.
    Frederick M. Fowkes, Contact Angle, Wettability, and Adhesion. Adv. in Chemistry Series 43, Am. Chem. Soc., Washington, DC, 1964.Google Scholar
  2. 2.
    W. E. J. Neal and R. W. Fane, Ellipsometry and Its Applications to Surface Examination, J. Phys. (E) Scientific Instruments 6, 1973, pp. 409–416.CrossRefGoogle Scholar
  3. 3.
    Richard F. Spanier, Ellipsometry, Ind. Res., Sept. 1975, pp. 73–76.Google Scholar
  4. 4.
    P. J. Hendra and M. Fleischmann, Raman Spectroscopy at Surface, in Topics in Surface Chemistry, Eric Kay and Paul Bagus, (Eds.) Plenum Press, New York, 1978.Google Scholar
  5. a. Ibid., Stig Andersson, Spectroscopy of Surface Vibrations, p. 292.Google Scholar
  6. 5.
    J. K. Barr and P. A. Flournoy, Internal Reflection in Spectroscopy, in B. Carroll (Ed.), Physical Methods in Macromolecular Chemistry, Vol. 1, Dekker, New York, 1969.Google Scholar
  7. 6.
    James E. Stewart, Infrared Spectroscopy, Marcel Dekker, New York, 1970.Google Scholar
  8. 7.
    K. Siegbahn, C. Nordling, A. Fahlman, R. Nordberg, K. Hamrin, J. Hedman, G. Johansson, T. Bergmark, S. E., Karlsson, I. Lindgren and B. Kindbert, ESCA, Atomic Molecular and Solid State Structure Studied by Means of Electron Spectroscopy, Almqvist and Wiksells, Uppsala, 1967.Google Scholar
  9. 8.
    H. K. Herglotz and H. L. Suchan, ESCA - A New Tool for Surface Research, Advances in Colloid and Interface Science 5 (1975), pp. 79–103.CrossRefGoogle Scholar
  10. 9.
    E. A. Stern, Structure Determination by X-Ray Absorption, Contemp. Phys. 19 (1978), pp. 289–310.CrossRefGoogle Scholar
  11. 10.
    F. W. Karasek, Developments in ISS/SIMS, Research & Development, Jan. 1978, p. 26.Google Scholar
  12. 11.
    Analysis of Alloys and Thin Fibers Using Ion Scattering Spectroscopy. In: Quantitative Surface Analysis of Materials, N. S. Mclntyre, editor, ASTM Special Technical Publication 643, 1978.Google Scholar
  13. 12.
    H. Ibach, Electron Spectroscopy for Surface Analysis, Springer Verlag, New York, 1977, p. 3.CrossRefGoogle Scholar
  14. 13.
    A. Joshi, “SESD” A Complimentary Tool for Surface Analysis, φ the PHI Interface 1, Oct. 1978, p. 6, (Perkin Elmer Company Publication).Google Scholar
  15. 14.
    Richard L. Walter and R. D. Willis, Proton and Alpha Excitation. Chapter 6 of X-Ray Spectrometry, H. K. Herglotz and L. S. Birks, editors. Marcel Dekker, New York, 1978.Google Scholar
  16. 15.
    S. Y. Tong and M. A. Van Hove, Surface Crystallography by LEED, Springer Verlag, New York, 1979.Google Scholar
  17. 16.
    H. K. Herglotz, Carbon X-Radiation for Characterizing the Supramolecular Structure of Polymer Surfaces, J. Colloid and Interface Science 75, 1980, pp. 105–116.CrossRefGoogle Scholar
  18. 17.
    T. P. Schreiber Coordinated Surface Analysis. American Laboratory, March 1979, p. 43.Google Scholar
  19. 18.
    H. K. Herglotz, The Role of ESCA in Surface Characterization, Technical Paper FC 77-673, The Association for Finishing Processes of SME, Dearborn, Michigan, 1977.Google Scholar
  20. 19.
    Kurt F. J. Heinrich and Harvey Yakowitz, Electron Probe Microanalyzers, Chapter 7 of X-Ray Spectrometry, H. K. Herglotz and L. S. Birks, editors, Marcel Dekker, New York, 1978, p. 165.Google Scholar
  21. 20.
    Thomas J. Baum, An Overview of Microprobe Development, φ The PHI Interface 2, No. 3 1979, p. 4 (Perkin Elmer Company Publication).Google Scholar
  22. 21.
    C. D. Wagner, W. M. Riggs, L. E. Davis, J. F. Moulder, G. E. Muilenberg (editor), Handbook of X-Ray Photoelectron Spectroscopy, Perkin Elmer Company, Physical Electronics Division, Eden Prairie, Minn. 1979.Google Scholar
  23. 22.
    φ The PHI Interface 1 No. 1, July 1978, p. 4.Google Scholar
  24. 23.
    Scanning Auger Microprobe, Brochure by Physical Electronics Industries, Inc.Google Scholar
  25. 24.
    Gene R. Sparrow, “Ions Working for You,” Industrial Research, Sept. 1976, pp. 81–85.Google Scholar
  26. 25.
    U. Gelius, E. Basilier, S. Svensson, T. Bergmark and K. Siegbahn, A. High Resolution ESCA Instrument with X-Ray Monochromator for Gases and Solids, J. Electron Spectroscopy and Related Phenomena 2 1974, pp. 405–434.Google Scholar
  27. 26.
    Carl Nordling, Atomic and Molecular Physics, Acta Universitatis Upsaliensis, Uppsala University 500 years. 8 Uppsala, 1976.Google Scholar
  28. 27.
    Edward N. Sickafus, Surface Analysis - A Mixed Bag of Tricks, Industrial Research & Development, June 1980, p. 126.Google Scholar

Copyright information

© Plenum Press, New York 1982

Authors and Affiliations

  • H. K. Herglotz
    • 1
  1. 1.Engineering Research and Development Division Experimental StationE. I. du Pont de Nemours and CompanyUSA

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