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Applications of IR Ellipsometric Spectroscopy to Surface Studies

  • M. J. Dignam

Abstract

Several methods whereby the polarizing properties of a planar interface may be used to determine the vibrational spectrum of adsorbed species are presented, including two recently proposed near null techniques based on the principle of orthogonal reflections.A particularly promising approach to surface IR spectroscopy, called Fourier transform reflection ellipsometry (FTRE), is described which involves the use of a Fourier transform spectrometer equipped with a special polarizing interferometer.

Data obtained on a rotating polarizer ellipsometric spectrometer are presented to illustrate the potential of such techniques, but particularly of FTRE, for studying surface reactions. The data chosen are for CO adsorption on Ni(110) and Ni(100), CO and H2 reaction on Ni(110), and the decomposition of CH3OH on Ni(100).

Keywords

Electron Energy Loss Spectroscopy Reference Surface Band Area Saturation Coverage Grid Polarizer 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1982

Authors and Affiliations

  • M. J. Dignam
    • 1
  1. 1.Department of ChemistryUniversity of TorontoTorontoCanada

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