Physical and Chemical Characterization of Interfaces by Electron Optical Methods

  • G. Thomas
  • R. Gronsky
  • O. L. Krivanek
  • R. K. Mishra
Part of the Materials Science Research book series (MSR, volume 14)


Although the study of ceramics using transmission electron microscopy (TEM) lagged behind metallurgy because of specimen preparation difficulties and because many ceramics are ionisation sensitive to 100kV electron beams, today there is considerable research activity. This is due to perfection of ion thinning methods (first devised by Castaing in the early 1950’s actually for metals) and improvements in instrumentation, particularly high voltage, high resolution and analytical microscopes. These developments and many applications have been summarized recently(1) and will not be given in any more detail in this review. However, it is important not to underestimate the severe problems of specimen preparation methods for ceramic materials.


Silicon Nitride Contrast Transfer Function Oxynitride Glass 100kV Electron Beam Specimen Preparation Method 
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  1. 1.
    G. Thomas and M. Goringe, Transmission Electron Microscopy of Materials, J. Wiley, New York, 1979.Google Scholar
  2. 2.
    R. B. Hirsch, R. B. Nicholson, A. Howie, D. W. Pashley and M. J. Whelan, Electron Microscopy of Thin Crystals, Butter-worths, London, 1965.Google Scholar
  3. 3.
    R. K. Mishra, O. Vander Biest and G. Thomas, J. Am. Cer. Soc. 61, 122–26 (1978).CrossRefGoogle Scholar
  4. 4.
    L. J. Chen and G. Thomas, Phys. Stat. Sol. A25, 193 (1974).CrossRefGoogle Scholar
  5. 5.
    O. L. Krivanek, T. M. Shaw and G. Thomas, J. Appl. Phys. 50, 4223 (1979).CrossRefGoogle Scholar
  6. 6.
    R. K. Mishra, E. K. Goo and G. Thomas (this proceeding).Google Scholar
  7. 7.
    D. R. Clarke, Ultramicroscopy 4, 33 (1979).CrossRefGoogle Scholar
  8. 8.
    L. E. Thomas, S. Lentz and R. M. Fisher, 3rd Int. Conf. on HVEM, P. R. Swann, C. J. Humphreys and M. J. Goringe, eds. Academic Press, N. Y., 255–59 (1974).Google Scholar
  9. 9.
    M. Harmer, R. K. Mishra and G. Thomas, J. Am. Cer. Soc, in press.Google Scholar
  10. 10.
    R. Gronsky, in Grain Boundary Structure and Kinetics, R. W. Balluffi, ed., American Society for Metals (in press).Google Scholar
  11. 11.
    M. Born and E. Wolf, Principles of Optics, 5th ed., Pergamon Press, Oxford, 1975.Google Scholar
  12. 12.
    D. R. Clarke and G. Thomas, J. Am. Cer. Soc. 61, 114 (1978).CrossRefGoogle Scholar
  13. 13.
    D. R. Clarke and G. Thomas, J. Am. Cer. Soc. 60, 491 (1977).CrossRefGoogle Scholar
  14. 14.
    R. Gronsky, in 38th Ann. Proc. Electron Microscopy Soc. Amer., G. W. Bailey, ed., Claitors, Baton Rouge, 1980, p. 2.Google Scholar
  15. 15.
    Introduction to Analytical Electron Microscopy. J. J. Hren, J. I. Goldstein and D. C. Joy, eds., Plenum Press, 1979.Google Scholar
  16. 16.
    O. L. Krivanek, in 38th Ann. Proc. Electron Microscopy Soc. Amer., G. W. Bailey ed., Claitors, Baton Rouge, 1980, p. 86.Google Scholar
  17. 17.
    H. Tsunekawa, A. Nakata, T. Kamijo, K. Okutani, R. K. Mishra and G. Thomas, IEEE Trans. Magnetics, MAG-15, 1855 (1979).CrossRefGoogle Scholar
  18. 18.
    L. C deJonghe, private communication.Google Scholar

Copyright information

© Plenum Press, New York 1981

Authors and Affiliations

  • G. Thomas
    • 1
  • R. Gronsky
    • 1
  • O. L. Krivanek
    • 1
  • R. K. Mishra
    • 1
  1. 1.Materials and Molecular Research Division Lawrence Berkeley LaboratoryUniversity of CaliforniaBerkeleyUSA

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