TEM Studies on the Structure of Low Angle Grain Boundaries in Nickel Oxide

  • H. Schmid
  • M. Rühle
  • N. L. Peterson
Part of the Materials Science Research book series (MSR, volume 14)

Abstract

The structures of small angle grain boundaries (SAGB) are studied by means of high voltage electron microscopy (HVEM) in deformed and annealed NiO single crystals. A classification of different types of SAGB is presented. The geometrical parameters and dislocation structures are determined including the nature of extreneous dislocations. The analyzed boundaries show differences compared to boundaries in fcc metals. The differences are attributed to the influence of the ionic character of NiO.

Keywords

Nickel Hexagonal 

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Copyright information

© Plenum Press, New York 1981

Authors and Affiliations

  • H. Schmid
    • 1
    • 3
  • M. Rühle
    • 1
  • N. L. Peterson
    • 2
  1. 1.MPI für MetallforschungStuttgartGermany
  2. 2.Argonne National LaboratoryMSDArgonneUSA
  3. 3.Lawrence Berkeley LaboratoryBerkeleyUSA

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