TEM Studies on the Structure of Low Angle Grain Boundaries in Nickel Oxide
The structures of small angle grain boundaries (SAGB) are studied by means of high voltage electron microscopy (HVEM) in deformed and annealed NiO single crystals. A classification of different types of SAGB is presented. The geometrical parameters and dislocation structures are determined including the nature of extreneous dislocations. The analyzed boundaries show differences compared to boundaries in fcc metals. The differences are attributed to the influence of the ionic character of NiO.
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