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X-Ray Studies of Point Defects in Rare Gas Solids

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Recent Developments in Condensed Matter Physics

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Abstract

Point defects in solid Argon have been created by X-irradiation at 10 K. Lattice parameter change can be used as a measure of defect concentration. From dose curves the defect formation yield was determined. The absorbed energy per Frenkel pair was found to be EFP = (20 ± 5) eV. The volume of spontaneous recombination was determined to be v = 60 atomic volumes in Argon after irradiation at 10 K. From isochronal and isothermal annealing measurements at least 7 different annealing stages can be separated. The first 5 stages with annealing temperatures up to 23 K are due to single defect recombination. The activation energy for uncorrelated single defect recombination was found to be w = 55 meV.

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References

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Author information

Authors and Affiliations

  1. Institut für Angewandte Physik, Technischen Hochschule Darmstadt, 6100, Darmstadt, Germany

    R. Balzer & E.J. Giersberg

Authors
  1. R. Balzer
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  2. E.J. Giersberg
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Editor information

Editors and Affiliations

  1. University of Antwerpen (RUCA and UIA), Antwerpen, Belgium

    J. T. Devreese (Professor of Theoretical Physics, Chairman of the Conference) (Professor of Theoretical Physics, Chairman of the Conference)

  2. University of Antwerpen (RUCA), Antwerpen, Belgium

    L. F. Lemmens  & V. E. van Doren  & 

  3. University of Antwerpen (UIA), Antwerpen, Belgium

    J. van Royen

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© 1981 Springer Science+Business Media New York

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Balzer, R., Giersberg, E. (1981). X-Ray Studies of Point Defects in Rare Gas Solids. In: Devreese, J.T., Lemmens, L.F., van Doren, V.E., van Royen, J. (eds) Recent Developments in Condensed Matter Physics. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-3902-1_13

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  • DOI: https://doi.org/10.1007/978-1-4684-3902-1_13

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-3904-5

  • Online ISBN: 978-1-4684-3902-1

  • eBook Packages: Springer Book Archive

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