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Gold-Silicon Interface : Electron Energy Loss and Auger Spectroscopies Versus Gold Coverage

  • S. Nannarone
  • F. Patella
  • C. Quaresima
  • A. Savoia
  • F. Cerrina
  • M. Capozi
  • P. Perfetti

Abstract

1 monolayer, 20 monolayers and 100 monolayers of gold have been deposited on Si(111)2×1. Electronic properties of such a system have been studied by Energy Loss Spectroscopy and Auger Spectroscopy versus annealing temperature. At moderate annealing temperature Si migrates through the film. Higher annealing temperature results in gold islands formation : the electronic structure of discovered surface layer seems to be quite independent from gold film thickness.

Keywords

Auger Electron Spectroscopy Gold Film Auger Analysis Gold Coverage Gold Island 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1981

Authors and Affiliations

  • S. Nannarone
    • 1
  • F. Patella
    • 1
  • C. Quaresima
    • 1
  • A. Savoia
    • 1
  • F. Cerrina
    • 1
  • M. Capozi
    • 1
  • P. Perfetti
    • 1
  1. 1.P.U.L.S.-Laboratori Nazionali di FrascatiFrascatiItaly

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