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Defect Characterization by Means of the Scanning Laser Acoustic Microscope (SLAM)

  • D. E. Yuhas
  • L. W. Kessler
Part of the Acoustical Imaging book series (ACIM, volume 9)

Abstract

High frequency acoustic imaging represents a powerful technique for the nondestructive evaluation of optically opaque materials. In this report the Scanning Laser Acoustic Microscope (SLAM) is used to detect and characterize flaws in ceramics. SLAM micrographs showing typical examples of cracks, laminar flaws, porosity and solid inclusions are presented. The various flaw types are easily differentiated on the basis of their characterisitc acoustic signatures. The importance of an imaging approach to the nondestructive evaluation of ceramics is demonstrated.

Keywords

Silicon Nitride Flaw Type Acoustic Image Solid Inclusion Acoustic Microscope 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1980

Authors and Affiliations

  • D. E. Yuhas
    • 1
  • L. W. Kessler
    • 1
  1. 1.Sonoscan, Inc.BensenvilleUSA

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