The Structure of Grain Boundaries in Silicon Nitride Based Alloys

  • David R. Clarke
  • G. Thomas
Part of the Materials Science Research book series (MSR, volume 11)


Grain boundaries in silicon-based ceramics have been characterized by high resolution electron microscopy including the technique of lattice fringe imaging, and this work is illustrated with examples from both hot-pressed silicon nitrides (MgO and Y2O3 fluxed) and a magnesium-sialon (Mg1.86 Si1.67 Al2.47 O3.l9 N3.8l) temperature observations of the glassy phase are consistent with it being only a partially wetting phase, indicating that it cannot form a continuous film. The atomic configuration of the grain boundaries in both materials is presented together with lattice fringe observations of segregation at grain boundaries in the magnesium-sialon.


Silicon Nitride Lattice Fringe Glassy Phase High Resolution Electron Microscopy Fringe Spacing 
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Copyright information

© Plenum Press, New York 1978

Authors and Affiliations

  • David R. Clarke
    • 1
  • G. Thomas
    • 2
  1. 1.Rockwell International Science CenterThousand OaksUSA
  2. 2.University of CaliforniaBerkeleyUSA

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