Reactivity of Alumina Substrates with High Lead Glasses
The substrate in a thick film resistor cannot be completely inert because some degree of interaction with the glass in the resistor is required for bonding, and this interaction is guaranteed by the high temperatures used in processing. It has been determined1 that at least six properties of the glass contribute to microstructure development in thick film resistors, and that the presence of 8 to 10 wt% substrate material dissolved in a resistor glass has marked effects on microstructure development and electrical properties. Thus it is necessary to understand the kinetics of the glass-substrate interactions before the properties of a thick film circuit can be predicted for various processing conditions. This paper presents the findings of the initial studies of these interactions.
KeywordsThick Film Alumina Substrate Recession Rate Single Crystal Sapphire Glass Analysis
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