Abstract
After reviewing briefly different methods for the determination of silicon and oxygen self-diffusion coefficients a mass spectrometric technique, utilizing the stable isotopes silicon-30 and oxygen-18, will be discussed. The importance of silicon and oxygen data is pointed out in connection with rate-controlling steps and with structural information. For silicates an attempt will be made to estimate silicon and oxygen diffusivities from the radius ratio of their atoms or ions, assuming that this ratio depends on the extent of covalency in the Si-O bond.
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© 1975 Plenum Press, New York
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Schaeffer, H.A. (1975). Silicon and Oxygen Diffusion in Oxide Glasses. In: Cooper, A.R., Heuer, A.H. (eds) Mass Transport Phenomena in Ceramics. Materials Science Research, vol 9. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-3150-6_21
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DOI: https://doi.org/10.1007/978-1-4684-3150-6_21
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