X-Ray Diffraction Study of New Hafnium Compounds
The important use of x-ray powder diffraction as a tool in the identification of unknown crystalline materials is dependent on the proper standards being in the reference file. Such new standards are added yearly to the Powder Diffraction File. The main purpose of this paper is to present new data on several well characterized salts based primarily on hafnium both in the hydrated and anhydrated form.
KeywordsUnit Cell Volume Mandelic Acid Powder Diffraction File Deuterium Oxide Powder Diffraction Standard
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- 3.R. B. Hahn, “Determination of Zirconium - Hafnium Ratio and Its Applications in Geochemistry and Cosmochemistry”, paper presented at the 18th Detroit Anachem Conference, held at Hilton Hotel, Detroit Michigan, 14 Oct., 1970.Google Scholar
- 4.Frank L. Chan and W. Barclay Jones, “Determination of Zirconium, Hafnium Niobium, Tantalum, Molybdenum and Tungsten in Aqueous Solutions by Radioisotopic - Excited X-ray Fluorescence”, in K. F. J. Heinrich and C. O. Ruud Editiors, Advances in X-ray Analysis, Vol. 15, 1972, in pressGoogle Scholar
- 6.Frank L. Chan and G. G. Johnson, Jr., “Some X-ray Diffraction Spectra and Characteristic Properties of Deuterium Ocide Inorganic Compounds”, in Developments in Applied Spectroscopy, E. L. Grove and A. J. Perkins, Editors.Google Scholar
- 7.Frank L. Chan and G. G. Johnson, Jr., “A Study on the Change of Water of Crystallization by X-ray Diffraction Data Stored in ASTM Magnetic Tape”, in Developments in Applied Spectroscopy“, E. L. Grove and A.J. Perkins, Editors, Vol. 8, 53–75, 1970.Google Scholar
- 9.Frank L. Chan, U.S. Patent No. 3, 384, 162Google Scholar
- 10.Frank L. Chan, U. S. Patent No. 3, 230, 367Google Scholar
- 11.Frank L. Chan, U.S. Patent No. 3, 079, 500Google Scholar
- 12.Frank L. Chan, U.S. Patent No. 3, 160, 748Google Scholar
- 13.Harold P. Klug and Leroy E. Alexander, “X-ray Diffraction Procedures”, John Wiley and Sons, Inc. New York, 1954.Google Scholar
- 15.Johnson, G. G. Jr. FORTRAN IV. Programs (Version 12) for the Identification of Multiphase Powder Diffraction Patterns. Joint Committee on Powder Diffraction Standards 154 pp (1970).Google Scholar
- 17.Evans, H. T., Jr., D. E. Appleman, D. S. Handwerker. The Least-Squares Refinement of Crystal Unit Cells with Powder Diffraction Data by an Automatic Computer Indexing Method. Abs. Amer. Cryst. Assoc., Cambridge, Mass., Program, p. 42–43Google Scholar
- 18.Powder Diffraction File, Compiled by Joint Committee on Powder Diffraction Standards, Inorganic Index 1971.Google Scholar