Quantitative SEM and Raster Profilometer Analysis of Fracture Surfaces
Part of the Fracture Mechanics of Ceramics book series (FMOC, volume 1)
The characterization of fracture surfaces is usually done by visual examination of light microscope (LM), transmission electron microscope (TEM) or scanning electron microscope (SEM) images.
Unable to display preview. Download preview PDF.
- 1.R. C. Spragg, D. J. Whitehouse, Proceedings of the Institution of Mechanical Engineers, 185 (1970–71).Google Scholar
- 2.J. B. P. Williamson, Proceedings of the Institution of Mechanical Engineers, 182 (1967–69).Google Scholar
- 4.H.T. McAdams, Proceedings of the International Conference on Surface Technology, Society of Manufacturing Engineers, May (1973)Google Scholar
- 5.E. W. White, H.A, McKinstry, A. Diness, Proc. of a Symposium Sponsored by Amer. Cer. Soc., Off. of Nav. Res., and NBS., Nat. Bur. Stds. Pub. 348, 309–316 (1972)Google Scholar
- 6.J. M. Samuels, A. B. Draper, Trans. Nat. Die Casting Cong. Oct. (1973)Google Scholar
© Plenum Press, New York 1974