Transmission Electron Microscopy of Defect Aggregates in Non-Metallic Crystalline Solids

  • L. W. Hobbs
Part of the Nato Advanced Study Institutes Series book series (NSSB, volume 19)


Defect probes such as spectroscopy, magnetic resonance, electrical and thermal conductivity are indirect techniques since they rely on the average response of a large number of similar defects to the probe, whether it be a light photon, microwave quantum, conduction electron or lattice phonon. Microscopy is a direct technique for observing structure of individual defects.


Burger Vector Dislocation Loop Alkali Halide Bloch Wave Dispersion Surface 
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Transfer theory of the microscope

  1. K.-J. Hanszen, Advances in Optical and Electron Microscopy, 1971, 4, 1–84.Google Scholar
  2. F. A. Lenz, in ‘Electron Microscopy in Material Science’, ed.Google Scholar
  3. U. Valdrè, Academic Press, New York and London, 1971, pp 540 - 69.Google Scholar
  4. P. W. Hawkes, ’Electron Optics and Electron Microscopy’, Taylor and Francis, London, 1972.Google Scholar

Lattice Images

  1. J. M. Cowley and A. F. Moodie, Proc. Phys. Soc., 1960, 76, 378.Google Scholar
  2. J. S. Anderson in ‘Surface and Defect Properties of Solids’, ed. M. W. Roberts and J. M. Thomas, The Chemical Society, London, 1972, vol. 1, pp. 1–53; J. S. Anderson and R. J. D. Tilley, ibid., 1974, vol. 3, pp. 1–56.Google Scholar
  3. D. J. H. Cockayne, J. R. Parsons and C. W. Hoelke, Phil. Mag., 1971, 24, 139.Google Scholar
  4. J. G. Allpress, E. A. Hewat, A. F. Moodie and J. V. Sanders, Acta Cryst., 1972, A28, 528.Google Scholar
  5. J. G. Allpress and J. V. Sanders, J. Appi. Cryst., 1973, 6, 165.Google Scholar
  6. S. Iijima, S. Kimura and M. Goto, Acta Cryst., 1973, A29, 632; 1974, A30, 251.Google Scholar
  7. S. Iijima and J. G. Allpress, Acta Cryst., 1974, A30, 22; 29.Google Scholar
  8. D. F. Lynch, A. F. Moodie and M. A. O’Keefe, Acta Cryst., 1975, A31, 300.Google Scholar

Dynamical theory of electron diffraction

  1. P. B. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley and M. J. Whelan, ‘Electron Microscopy of Thin Crystals’, Butterworths, London, 1967.Google Scholar
  2. A. Howie, in ‘Electron Microscopy in Material Science’, ed. U. Valdre, Academic Press, New York and London, 1971, pp. 274–300.Google Scholar
  3. M. Wilkens, Phys. Stat. Sol., 1964, 6, 939.Google Scholar
  4. B. Jouffrey and D. Taupin, Phil. Mag., 1967, 16, 703.Google Scholar
  5. A. Howie and Z. S. Basinski, Phil. Mag., 1968, 17, 1039.Google Scholar
  6. R. Serneels and R. Gevers, Phys. Stat. Sol. (b), 1972, 50, 99; 1973, 56, 681.Google Scholar
  7. M. Wilkens, K. H. Katerbau and M. Ruble, Z. Naturforschung, 1973, 28a, 681.Google Scholar

Weak beam technique

  1. D. J. H. Cockayne, Z. Naturforschung, 1972, 27a, 452.Google Scholar
  2. R. de Ridder and S. Amelinckx, Phys. Stat. Sol. (b), 1971, 43, 541.Google Scholar
  3. D. J. H. Cockayne, J. Microscopy, 1973, 98, 116.Google Scholar
  4. R. Sandstrom, Phys. Stat. Sol. (a), 1973, 18, 639.Google Scholar
  5. R. C. Perrin and E.J. Savino, J. Microscopy, 1973, 98, 214.Google Scholar

Electron microscopy of ionic crystals

  1. L. W. Hobbs, J. de Physique, 1973, 34 (C9), 227.Google Scholar
  2. L. W. Hobbs, in 1 Surface and Defect Properties of Solids1, ed. M. W. Roberts and J. M. Thomas, The Chemical Society, London, 1975, Vol. 4, pp. 152–250.Google Scholar

Electron microscopy of organic solids

  1. D. T. Grubb, J. Materials Science, 1974, 9, 1715.Google Scholar
  2. R. M. Glaeser, in ‘Physical Aspects of Electron Microscopy and Microbeam Analysis’, ed. B.M. Siegel and D.R. Beaman, John Wiley, New York, 1975, pp. 205–229.Google Scholar
  3. W. Jones, J.M. Thomas, J. O. Williams and L. W. Hobbs, J. Chem. Soc. Faraday Trans. II, 1975, 71, 138.Google Scholar

Electron microscopy of semiconductors

  1. H. Alexander and P. Haasen, Solid State Physics, 1968, 22, 28.Google Scholar
  2. R. S. Nelson, in ‘Radiation Damage and Defects in Semiconductors’, The Institute of Physics, London, 1973, pp. 140–158Google Scholar

Dislocation contrast

  1. A. K. Head, M. H. Loretto and P. Humble, Phys. Stat. Sol., 1967, 20, 505.Google Scholar
  2. P. Humble, Phys. Stat. Sol., 1967, 21, 733.Google Scholar
  3. M. J. Norgett, R. C. Perrin and E. J. Savino, J. Phys. F., 1972, 2, L73.Google Scholar
  4. A. K. Head, P. Humble, L. M. Clarebrough, A. J. Morton and C. T. Forwood, ‘Computed Electron Micrographs and Defect Identification’, Defects in Crystalline Solids, ed, S. Amelinckx, R. Gevers and J. Nihoul, Vol. 7, North Holland, Amsterdam, 1973.Google Scholar

Dislocation loop contrast

  1. R. Bullough, D. H. Maher and R. C. Perrin, Phys. Stat. Sol. (a), 1970, 43, 689, 707.Google Scholar
  2. D. M. Maher and B. L. Eyre, Phil. Mag., 1971, 23, 409.Google Scholar
  3. D. M. Maher, M. H. Loretto and A. F. Bartlett, Phil. Mag., 1971, 24, 181.Google Scholar
  4. M. Wilkens, in ‘Modern Diffraction and Imaging Techniques in Material Science’, ed S. Amelinckx et al., North Holland, Amsterdam, 1970, pp. 233–256.Google Scholar
  5. M. Wilkens, in ‘Vacancies and Interstitials in Metals’, ed A. Seeger et al., North Holland, Amsterdam, 1970, pp. 485–529.Google Scholar
  6. M. Wilkens and M. Rühle, Phys. Stat. Sol.(b), 1972, 49, 749.Google Scholar
  7. F. Haussermann, M. Rühle and M. Wilkens, Phys. Stat. Sol.(b), 1972, 50, 445.Google Scholar

Inclusion contrast

  1. J. van Landuyt, R. Gevers and S. Amelinckx, Phys. Stat. Sol., 1965, 10, 319.Google Scholar
  2. H. Gleiter, Phil. Mag., 1968, 18, 847.Google Scholar
  3. M. Rühle, in ‘Radiation Damage in Reactor Materials’, IAEA, Vienna, 1969, IAEA-SM-120/B-2, pp. 113–159.Google Scholar
  4. M. Rühle, in ‘Radiation Induced Voids in Metals’, ed. J. W. Corbett and L. C. Ianiello, USAEC. Springfield, Va., 1972, pp. 255–291.Google Scholar
  5. M. Rühle and M. Wilkens, Proc. 5th Europ. Conf, on Electron Microscopy, Manchester, 1972, p. 416.Google Scholar

Copyright information

© Plenum Press, New York 1976

Authors and Affiliations

  • L. W. Hobbs
    • 1
  1. 1.Materials Development DivisionAtomic Energy Research EstablishmentHarwellUK

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