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Transmission Electron Microscopy of Defect Aggregates in Non-Metallic Crystalline Solids

  • L. W. Hobbs
Part of the Nato Advanced Study Institutes Series book series (NSSB, volume 19)

Abstract

Defect probes such as spectroscopy, magnetic resonance, electrical and thermal conductivity are indirect techniques since they rely on the average response of a large number of similar defects to the probe, whether it be a light photon, microwave quantum, conduction electron or lattice phonon. Microscopy is a direct technique for observing structure of individual defects.

Keywords

Burger Vector Dislocation Loop Alkali Halide Bloch Wave Dispersion Surface 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1976

Authors and Affiliations

  • L. W. Hobbs
    • 1
  1. 1.Materials Development DivisionAtomic Energy Research EstablishmentHarwellUK

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