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Field-Ion-Mass-Spectrometry Investigating Electronic Structure and Reactivity of Surfaces

  • Jochen H. Block
Part of the NATO Advanced Study Institutes Series book series (NSSB, volume 16)

Abstract

In FIMS an atoms or molecule is ionized in front of a surface by the interaction of a high electric field. The electron enters the solid. The positive ion is analyzed mass spectrometrically. Originally, the analytical aspect of a mass analysis of field ions with low fragmentation was the main emphasis of development. Principles of FIMS have been summarized (1,2,3). Now, by using mass and energy analysis of field ions simultaneously, details about the mechanism of field ionization can be studied. It will be demonstrated in this contribution that the electronic structure of a metal surface interferes with the ionization process as well as the reactivity of a metal surface. With the great advantage of extreme surface specificity on single crystal planes and with the possibility to identify individual surface molecules the energy distribution of field ions now can give additional information on electronic states of a surface and on the energetics of surface processes.

Keywords

Energy Distribution Work Function Energy Deficit Proton Transfer Reaction Field Ionization 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1976

Authors and Affiliations

  • Jochen H. Block
    • 1
  1. 1.Fritz-Haber-InstitutMax-Planck-GesellschaftDahlemGermany

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