Field-Ion-Mass-Spectrometry Investigating Electronic Structure and Reactivity of Surfaces

  • Jochen H. Block
Part of the NATO Advanced Study Institutes Series book series (NSSB, volume 16)


In FIMS an atoms or molecule is ionized in front of a surface by the interaction of a high electric field. The electron enters the solid. The positive ion is analyzed mass spectrometrically. Originally, the analytical aspect of a mass analysis of field ions with low fragmentation was the main emphasis of development. Principles of FIMS have been summarized (1,2,3). Now, by using mass and energy analysis of field ions simultaneously, details about the mechanism of field ionization can be studied. It will be demonstrated in this contribution that the electronic structure of a metal surface interferes with the ionization process as well as the reactivity of a metal surface. With the great advantage of extreme surface specificity on single crystal planes and with the possibility to identify individual surface molecules the energy distribution of field ions now can give additional information on electronic states of a surface and on the energetics of surface processes.


Energy Distribution Work Function Energy Deficit Proton Transfer Reaction Field Ionization 
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  1. (1).
    E.W. Müller and T.T. Tsong, Field Ion Microscopy Principles and Applications, American Elsevier 1969Google Scholar
  2. (2).
    R. Gomer, Field Emission and Field Ionization, Harvard University Press 1961Google Scholar
  3. (3).
    H.D. Beckey, Field Ionization Mass Spectrometry, Pergamon Press 1971Google Scholar
  4. (4).
    A.J. Jason, R.P. Burns and M.G. Inghram, J. Chem. Phys. 43 (1965) 3762CrossRefGoogle Scholar
  5. (5).
    A.J. Jason, R.P. Burns, A.C. Parr and M.G. Inghram, J. Chem. Phys. 44 (1966) 4351CrossRefGoogle Scholar
  6. (6).
    H.J. Heinen, F.W. Rüllgen and H.D. Beckey, Z. Naturf. 29a (1974) 773Google Scholar
  7. (7).
    I.V. Goldenfeld, E.N. Korol and V.A. Pokrovsky, Int. J. Mass Spectr. Ion Phys. 5 (1970) 337CrossRefGoogle Scholar
  8. (8).
    E.W. Müller and S.V. Krishnaswamy, Surface Sci. 36 (1973) 29CrossRefGoogle Scholar
  9. (9).
    E.W. Müller and T. Sakurai, J. Vac. Sci. Technol. 11 (1974) 878CrossRefGoogle Scholar
  10. (10).
    T. Utsumi and O. Nishikawa, J. Vac. Sci. Technol. 9 (1972) 477CrossRefGoogle Scholar
  11. (11).
    T.T. Tsong and E.W. Müller, J. Chem. Phys. 41 (1964) 3279CrossRefGoogle Scholar
  12. (12).
    A.J. Jason, Phys. Rev. 156 (1967) 266CrossRefGoogle Scholar
  13. (13).
    A.A. Lucas and M. Sunzic, J. Vac. Sci. Technol. 9 (1972) 725CrossRefGoogle Scholar
  14. (14).
    J.A. Appelbaum and E.G. McRae, Surface Sci. 47 (1975) 445CrossRefGoogle Scholar
  15. (15).
    M.E. Alferieff and C.B. Duke, J. Chem. Phys. 46 (1967) 438CrossRefGoogle Scholar
  16. (16).
    T. Utsumi and N.V. Smith, Phys. Rev. Letters 33 (1974) 1294CrossRefGoogle Scholar
  17. (17).
    N.E. Christensen and B. Feuerbacher, Phys. Rev. B 10 (1974) 2349CrossRefGoogle Scholar
  18. (18).
    G.R. Hanson, G.E. Humes and M.G. Inghram, Chem. Phys. Letters 27 (1974) 479CrossRefGoogle Scholar
  19. (19).
    J.H. Block, Advances in Mass Spectrometry Vol. 6 (1974) 109Google Scholar
  20. (20).
    J.H. Block, Z. Phys. Chem. N.F. 64 (1969) 199CrossRefGoogle Scholar
  21. (21).
    H.D. Beckey, Z. Naturf. 14A (1959) 712, 15A (1960) 822Google Scholar
  22. (22).
    W.A. Schmidt, Z. Naturf. 19a (1964) 318Google Scholar
  23. (23).
    I.V. Goldenfeld, V.A. Nazarenko and V.A. Prokowsky, Dokl. Akad. Nank SSSR 161 (1965) 276Google Scholar
  24. (24).
    A.R. Anway, J. Chem. Phys. 50 (1969) 2012CrossRefGoogle Scholar
  25. (25).
    F.W. Röllgen and H.D. Beckey, Surface Sci. 27 (1971) 321CrossRefGoogle Scholar
  26. (26).
    L. Onsager, J. Chem. Phys. 2 (1934) 599CrossRefGoogle Scholar
  27. (27).
    F.W. Röllgen and H.D. Beckey, Surface Sci. 23 (1970) 69CrossRefGoogle Scholar
  28. F.W. Röllgen and H.D. Beckey, Surface Sci. 24 (1971) 100CrossRefGoogle Scholar

Copyright information

© Plenum Press, New York 1976

Authors and Affiliations

  • Jochen H. Block
    • 1
  1. 1.Fritz-Haber-InstitutMax-Planck-GesellschaftDahlemGermany

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