Field-Ion-Mass-Spectrometry Investigating Electronic Structure and Reactivity of Surfaces
In FIMS an atoms or molecule is ionized in front of a surface by the interaction of a high electric field. The electron enters the solid. The positive ion is analyzed mass spectrometrically. Originally, the analytical aspect of a mass analysis of field ions with low fragmentation was the main emphasis of development. Principles of FIMS have been summarized (1,2,3). Now, by using mass and energy analysis of field ions simultaneously, details about the mechanism of field ionization can be studied. It will be demonstrated in this contribution that the electronic structure of a metal surface interferes with the ionization process as well as the reactivity of a metal surface. With the great advantage of extreme surface specificity on single crystal planes and with the possibility to identify individual surface molecules the energy distribution of field ions now can give additional information on electronic states of a surface and on the energetics of surface processes.
KeywordsMethane Benzene Recombination Helium Amide
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