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High Resolution Electron Microscopy of Reacting Solids

  • G. Schiffmacher
  • H. Dexpert
  • P. Caro

Abstract

High resolution electron microscopes like the JEM 100C used in the present study have a resolution close to 3Å between points.This is within the range of interplanar distances for a score of inorganic compounds.It is possible to have images of the periodic poten-tial in the crystal,that is an image of the atomic distribution. The images are formed by interference of the direct beam with one,or several,diffracted beams.The images have the same periodicity as the diffracted atomic planes with a resolution which can be as low as 1.4 Å.Very stringent conditions are to be meet, especially with regard to the sample thickness and orientation.To obtain a convenient contrast it is necessary to underfocus the objective by some hundreds of Angströms. (1).

Keywords

Rare Earth Atomic Plane Thin Film Sample High Resolution Electron Microscopy Atomic Distribution 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    J.M. Cowley, S. Iijima Zeit. Natur. 27a, 445 1972Google Scholar
  2. 2.
    P.E. Caro N:B:S: 364 5th Materials Research Symp. 1972Google Scholar
  3. 3.
    H. Dexpert, G. Schiffmacher, P. Caro J. Sol. State Chem. 15, 301 1975CrossRefGoogle Scholar
  4. 4.
    P. Caro, J.C. Achard, 0. De Pous Coll. CNRS 180, 285 1970Google Scholar
  5. 5.
    C. Boulesteix, P. Caro, M. Gasgnier, Ch. Henry la Blanchetais and G. Schiffmacher Acta Cryst. A 27, 552 1971Google Scholar

Copyright information

© Springer Science+Business Media New York 1977

Authors and Affiliations

  • G. Schiffmacher
    • 1
  • H. Dexpert
    • 1
  • P. Caro
    • 1
  1. 1.Laboratoire des Terres Rares du CNRSBellevueFrance

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