Film Thickness Determinations in Moving Saturated Superfluid 4He Films

  • Robert B. Hallock


Preliminary results of precision measurements of the velocity dependent saturated film thickness are presented. We find agreement within experimental errors with predictions based on the theory of Kontorovich. These measurements rule out a strong velocity dependence for ρs/ρ in saturated films. We also report the first observations of thickness changes due to third sound in saturated films by use of direct capacitance techniques. At 1.46K the attenuation of third sound at 1.2 Hz is found to be about 0.008 cm−1.


Thickness Change Film Flow Persistent Current Rhode Island 02912 Oxygen Free High Conductivity 
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  1. (1).
    V. M. Kontorovich, Zh. Eksp. Theor. Fiz. 30, 805 (1956). [Soviet Phys. -JETP 3 ,770 (1956)].Google Scholar
  2. (2).
    W. E. Keller, Phys. Rev. Lett. 24, 569 (1970).ADSCrossRefGoogle Scholar
  3. (3).
    E. R. Huggins, Phys. Rev. Lett. 24, 573 (1970).ADSCrossRefGoogle Scholar
  4. (4).
    D. L. Goodstein and P. G. Saffman, Proc. R. Soc. Lond. A 325. 447 (1971).ADSGoogle Scholar
  5. (5).
    D. J. Bergman, Proc. R. Soc. Lond. a 333, 261 (1973).ADSCrossRefGoogle Scholar
  6. (6).
    L. J. Campbell, to be published.Google Scholar
  7. (7).
    E. von Spronsen, H. J. Verbeek, R. de Bruyn Ouboter, K. W. Taconis and H. van Beelan, Phys. Lett. A 45, 49 (1973).ADSCrossRefGoogle Scholar
  8. (8).
    G. A. Williams and R. Packard, Phys. Rev. Lett. 32, 587 (1974).ADSCrossRefGoogle Scholar
  9. (9).
    E. B. Flint and R. B. Hallock, Bull. Am. Phys. Soc. 19, 436 (1974) and Phys. Rev. B (March, 1975).Google Scholar
  10. (10).
    M. E. Banton, J. K. Hoffer and W. E. Keller, Bull. Am. Phys. Soc. 19, 436 (1974).Google Scholar
  11. (11).
    G. M. Graham and E. Vittoratos, Phys. Rev. Lett. 33, 1136 (1974).ADSCrossRefGoogle Scholar
  12. (12).
    E. B. Flint, Ph.D. Dissertation, University of Massachusetts, 1974.Google Scholar
  13. (13).
    K. Telschow, J. Wang and I. Rudnick, J. Low Temp. Phys. (to be published); see also K. Telschow, Ph.D. Dissertation, UCLA, 1973.Google Scholar
  14. (14).
    E. van Spronsen, H. J. Verbeek, H. van Beelen, R. de Bruyn Ouboter and K. W. Taconis, Physica (to be published).Google Scholar
  15. (15).
    T. G. Wang and D. Petrac (preprint).Google Scholar
  16. (16).
    See, for example, K. R. Atkins and I. Rudnick, Progress in Low Temperature Physics Vol. 6, ed. C. J. Gorter, (North Holland, Amsterdam, 1970), Chapter 2, p. 37.Google Scholar
  17. (17).
    C. W. F. Everitt, K. R. Atkins and A. Denenstein, Phys. Rev. 136, 1494 (1964).ADSCrossRefGoogle Scholar
  18. (18).
    E. van Spronsen, H. J. Verbeek, H. van Beelen, R. de Bruyn Ouboter and K. W. Taconis have reported third sound oscillations in their very long narrow flow capillaries. They study these oscillations by observing bulk level changes in their capacitors.Google Scholar
  19. (19).
    Oxygen Free High Conductivity.Google Scholar
  20. (20).
    R. B. Hallock and E. B. Flint, Phys. Rev. A 10, 1285 (1974).ADSCrossRefGoogle Scholar
  21. (21).
    H. J. Verbeek, E. van Spronsen, H. Mars, H. van Beelan, R. de Bruyn Ouboter and K. W. Taconis, Physica (Utrecht) 73, 621 (1974).ADSCrossRefGoogle Scholar
  22. (22).
    R. K. Galkiewicz and R. B. Hallock, Phys. Rev. Lett. 33, 1073 (1974).ADSCrossRefGoogle Scholar
  23. (23).
    L. J. Campbell, Proceedings of Scottish Universities Summer School, (St. Andrews, 1974) in press.Google Scholar
  24. (24).
    E. B. Flint and R. B. Hallock, Rev. Sci. Instrum. 46, 100 (1975)ADSCrossRefGoogle Scholar
  25. (25).
    Westfield Gauge Co., Westfield, Mass. has the capability to measure inside and outside diameters to an accuracy of about ± 0.2.Google Scholar
  26. (26).
    Union Carbide Corporation.Google Scholar
  27. (27).
    Millipore Corporation, Bedford, Mass. 01730.Google Scholar
  28. (28).
    This will be done in the future in an attempt to see if the observation of thinning depends critically on the flow surface in an experiment of this type. Ref. 9 suggests that it will not, but ref. 10 suggests that it may.Google Scholar
  29. (29).
    The present measurements were made using a General Radio 1615A capacitance bridge and an HR-8 as a null detector. Helium level measurements could be made to a sensitivity of 200Å (although it was not necessary to do so). Relative thinning was measured to a sensitivity of 0.6Å (2 x 10-6 pf).Google Scholar
  30. (30).
    R. B. Hallock (to be published).Google Scholar

Copyright information

© Plenum Press, New York 1975

Authors and Affiliations

  • Robert B. Hallock
    • 1
  1. 1.Department of PhysicsBrown UniversityProvidenceUSA

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