Abstract
The improvements gained by superconducting devices in electron microscopy are due partly to the properties of the superconductors and partly to the low temperatures which must be maintained. However, the low temperatures give rise to the most important disadvantage, namely the necessity for cryogenic techniques.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 1976 Plenum Press, New York
About this chapter
Cite this chapter
Dietrich, I. (1976). Superconducting Devices in Electron Microscopy. In: Superconducting Electron-Optic Devices. The International Cryogenics Monograph Series. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-2199-6_3
Download citation
DOI: https://doi.org/10.1007/978-1-4684-2199-6_3
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4684-2201-6
Online ISBN: 978-1-4684-2199-6
eBook Packages: Springer Book Archive