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Mobility Measurements in Polymers by Pulsed Electron Beams

  • Yoshio Inuishi
  • Kotaku Hayashi
  • Katsumi Yoshino

Abstract

Carrier mobilities of several polymers were studied by the time of flight method using a pulsed electron beam. The obtained mobilities at the field of 1 MV/cm were 2.7 × 10−5 cm2/Vsec for electron and 1.2 × 10−4 cm2/Vsec for hole in PET, 1.4 × 10−4 cm2/v sec for electron and 7 × 10−5 cm2/Vsec for hole in PS, and 1.6 × 10−4 cm2/Vsec for electron and 6.3 × 10−5 cm2/Vsec for hole in PEN at room temperature respectively. Schubweg and quantum yield of the carrier were also studied. It was found that the quantum yield (number of induced carriers per impinging electron) was influenced seriously by the molecular structure.

Keywords

Quantum Yield Transit Time Carrier Mobility Slow Component Mobility Measurement 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1).
    A. I. Korr, R. A. Arndt and A. C. Damask: Phys. Rev., Vol. 186 (1969) 938.ADSCrossRefGoogle Scholar
  2. 2).
    K. Hayashi, K. Yoshino and Y. Inuishi: Japan. J. appl. Phys., Vol. 12 (1973) 754 1089.ADSCrossRefGoogle Scholar
  3. 3).
    D. K. Davies: J. Phys. D: Appl. Phys., Vol. 5 (1972) 162.ADSCrossRefGoogle Scholar
  4. 4).
    O. Dehoust: Z. angew. Phys., Vol. 27 (1969) 268.Google Scholar
  5. 5).
    R. E. McCurry and R. M. Schaffert: IBM. J., Vol. 4 (1960) 359.CrossRefGoogle Scholar
  6. 6).
    E. H. Martin and J. Hirsh: J. Appl. Phys., Vol. 43.Google Scholar
  7. 7).
    N. F. Mott and R. W. Gurney: “Electronic Processes in Ionic Crystals” Oxford Univ. Press, Oxford, England (1957).Google Scholar
  8. 8).
    P. Langevin: Ann. Chem. Phys., Vol 28 (1903) 287 433.Google Scholar
  9. 9).
    W. D. Gill: J Appl. Phys., Vol. 43 (1972) 5033.ADSCrossRefGoogle Scholar

Copyright information

© Plenum Press, New York 1974

Authors and Affiliations

  • Yoshio Inuishi
    • 1
  • Kotaku Hayashi
    • 1
  • Katsumi Yoshino
    • 1
  1. 1.Faculty of EngineeringOsaka Univ.Yamada-Kami, Suita, OsakaJapan

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