Mobility Measurements in Polymers by Pulsed Electron Beams
Carrier mobilities of several polymers were studied by the time of flight method using a pulsed electron beam. The obtained mobilities at the field of 1 MV/cm were 2.7 × 10−5 cm2/Vsec for electron and 1.2 × 10−4 cm2/Vsec for hole in PET, 1.4 × 10−4 cm2/v sec for electron and 7 × 10−5 cm2/Vsec for hole in PS, and 1.6 × 10−4 cm2/Vsec for electron and 6.3 × 10−5 cm2/Vsec for hole in PEN at room temperature respectively. Schubweg and quantum yield of the carrier were also studied. It was found that the quantum yield (number of induced carriers per impinging electron) was influenced seriously by the molecular structure.
KeywordsQuantum Yield Transit Time Carrier Mobility Slow Component Mobility Measurement
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- 4).O. Dehoust: Z. angew. Phys., Vol. 27 (1969) 268.Google Scholar
- 6).E. H. Martin and J. Hirsh: J. Appl. Phys., Vol. 43.Google Scholar
- 7).N. F. Mott and R. W. Gurney: “Electronic Processes in Ionic Crystals” Oxford Univ. Press, Oxford, England (1957).Google Scholar
- 8).P. Langevin: Ann. Chem. Phys., Vol 28 (1903) 287 433.Google Scholar