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Electronic Signal Processing for Raman Scattering Measurements

  • E. Robert Schildkraut

Abstract

General signal processing techniques for laboratory Raman spectroscopy and Remote Raman spectroscopy using cw and pulsed lasers are discussed. Chopped and pulsed source/time gated detection techniques are outlined. Detectors such as photomultiplier and image tubes, SEC Vidicon sensors, image dissectors, and multiplex spectrometers are discussed and some of their relative merits evaluated. Computer aided data reduction and techniques for fluorescence suppression in the signal and in the display are covered.

A brief comparison of signal processing systems for Remote Raman, Micro-Raman (spectra of single particles one micron in diameter) and other high background instrumental configurations are examined. Suitable references are detailed for further study of each of these topics.

Keywords

Raman Spectroscopy Resonance Effect Signal Processing System Experimental Advance Fourier Transform Spectroscopy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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Supplementary References Multiplex Spectroscopy:

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Noise Analysis:

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    C. D. Motchenbacher and F. C. Fitchen, “Low-Noise Electronic Design,” (John Wiley & Sons, New York, 1973).Google Scholar
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    Athanasios Papoulis, “The Fourier Integral and Its Applications,” (McGraw-Hill, New York, 1962).MATHGoogle Scholar

Detectors-Imaging and Non-Imaging:

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    B. Kazan and M. Knoll, “Electronic Image Storage,” (Academic Press, New York, 1968).Google Scholar
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    Daniel R. Frankl, “Electrical Properties of Semiconductor Surfaces,” (Pergamon Press, New York, 1967).Google Scholar
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    Walter G. Jung, “Camera System Design Considerations Involved in Application of The Silicon Target Vidicon,” Available from MTI Division, KMS Industries, Inc., Cockeysville, Md. 21030.Google Scholar
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    T. Kohler, et al, “The Silicon Diode Array Camera Tube for Near Infrared TV Applications,” 1969 Electro-Optical Systems Design Conference.Google Scholar
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    A. H. Sommer, “Photoemissive Materials,” (John Wiley & Sons, Inc., New York, 1968).Google Scholar

Examples of Spectroscopic Signal Processing Tricks:

  1. P.
    H. D. Pruett, “Photon Counting System for Rapidly Scanning Low-Level Optical Spectra,” Applied Optics 11, 2529 (1972).ADSCrossRefGoogle Scholar
  2. Q.
    Erwin G. Loewen, “Diffraction Grating Handbook,” Bausch & Lomb, Inc., (1970).Google Scholar
  3. R.
    Potts, Speed Suppression Programmed Scanning, Dow Chemical Co., ASTM publication.Google Scholar

Copyright information

© Springer Science+Business Media New York 1974

Authors and Affiliations

  • E. Robert Schildkraut
    • 1
  1. 1.Block Engineering, Inc.CambridgeUSA

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