Loss Mechanisms in Dielectric Waveguides
Scattering loss due to edge roughness introduced during processing can be expected to be a significant, and possibly even a limiting factor in the performance of integrated optical circuits employing two-dimensional confinement, and radiation loss due to bends can be expected to place a lower limit on the size of multifunction circuits and also to influence performance. In this lecture the nature of these losses is discussed, The results of analyses of scattering loss due to edge imperfections and bend loss are summarized and the limitations these losses place on circuits discussed, including the effect of the latter on resonator Q.
KeywordsPropagation Constant Loss Mechanism Radiation Loss Dielectric Waveguide Slab Waveguide
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