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Ion Damage Effects in Metals as Studied by Transmission Electron Microscopy

  • Manfred Wilkens

Summary

The paper deals with the application of transmission electron microscopy (TEM) to the study of radiation damage in metals due to ion bombardment. In a first part a brief review is given over the methods which are used for the analysis of the diffraction contrast of small point defect clusters, The following part is concerned with the application of these methods to the TEM study of ion damage, Special emphasis is given to the analysis of point defect clusters which are produced by displacement cascades.

Keywords

Dislocation Loop Superlattice Reflexion Foil Surface Frank Loop Loop Diameter 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1974

Authors and Affiliations

  • Manfred Wilkens
    • 1
  1. 1.Max-Planck-Institut für Metallforschung Institut für PhysikStuttgartGermany

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