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Abstract

Errors caused by serious malfunctioning of instruments will generally be discovered because they create unbelievable results. Small deviations are much more difficult to detect. Sections 6.4.2 and 7.6 dealt with aberrant processes taking place at high count rates and discussed preventive measures. The effect of noise, another instrument distortion, has been discussed in Sections 6.4.5 and 7.7.4. Still another deviation from the true results caused by instruments may be introduced by the scaler (see Sect. 2.3.5). The time base (Sect. 11.2.1) which opens and closes the counting gate can be coupled to the line frequency, and fluctuations in this will be reflected in the results obtained.

Keywords

Count Rate Background Activity Sample Activity Counting Efficiency Counting Gate 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References and Notes

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Copyright information

© Plenum Press, New York 1973

Authors and Affiliations

  • Jan Krugers
    • 1
  1. 1.IBM—NetherlandsThe HagueThe Netherlands

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