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Mechanism of Γ-X Electron Transfer in Type II (Al)GaAs/AlAs Superlattices and Multiple Quantum well Structures

  • J. Feldmann
  • E. Göbel
  • J. Nunnenkamp
  • J. Kuhl
  • K. Ploog
  • P. Dawson
  • C. T. Foxon
Part of the NATO ASI Series book series (NSSB, volume 253)

Abstract

In the conduction band of III-V semiconductors having cubic zinc-blende structure there are local energetic minima at the Γ, X and L points of the Brillouin zone. The idea that electrons in the conduction band are scattered by phonons between these valleys first became important in theories of the Gunn effect[1,2]. In recent years the intervalley scattering process has been extensively investigated in III–V semiconductors [3] mainly because of two reasons: first, ultrafast optical spectroscopy became available for investigating scattering processes which take place on a femtosecond timescale. Secondly, the transport properties of high-speed electronic semiconductor devices[4] are influenced by intervalley scattering.

Keywords

GaAs Layer Conduction Band State Valence Band State AlAs Layer Intervalley Scattering 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    P.N. Butcher and W. Fawcett, Phys. Lett., 21: 489 (1966)CrossRefGoogle Scholar
  2. 2.
    E.M. Conwell and M.O. Vassell, IEEE Trans. Electron Devices E-D, 13: 22 (1966)CrossRefGoogle Scholar
  3. 3.
    J. Shah, Sol. State Elect., 32: 1051 (1989)CrossRefGoogle Scholar
  4. 4.
    M. Heiblum. M.I. Nathan, D.C. Thomas and C.M. Knoedler, Phys. Rev. Lett., 55: 2200 (1985)CrossRefGoogle Scholar
  5. 5.
    E.E. Mendez, W.I. Wang, E. Calleja and C.E.T. Goncalves, App. Phys. Lett., 50: 1263 (1987)CrossRefGoogle Scholar
  6. 6.
    H.C. Liu, Appl. Phys. Lett., 51: 1019 (1987)CrossRefGoogle Scholar
  7. 7.
    E. Finkman, M.D. Sturge, M.H. Meynadier, R.E. Nahory, M.C. Tamargo, D.M. Hwang and C.C. Chang, J. Lum., 39: 57 (1987)CrossRefGoogle Scholar
  8. 8.
    B.A. Wilson, IEEE J. Quantum Elect., QE-24: 1763 (1988)CrossRefGoogle Scholar
  9. 9.
    K.J. Moore, P. Dawson and C.T. Foxon, Phys. Rev.B, 38: 3368 (1988)CrossRefGoogle Scholar
  10. 10.
    G. Peter, E. Göbel, W.W. Rühle, J. Nagle and K. Ploog, Superl. and Microstr., 5: 197 (1989)CrossRefGoogle Scholar
  11. 11.
    J. Feldmann, R. Sattmann, E. Göbel, J. Kuhl, J. Hebling, K. Ploog, R. Muralidharan, P. Dawson and C.T. Foxon, Phys. Rev. Lett., 62: 1892 (1989)CrossRefGoogle Scholar
  12. 12.
    P. Saeta, J.F. Federici, R.J. Fischer, B.I. Greene, L. Pfeiffer, R.C. Spitzer and B.A. Wilson, Appl. Phys. Lett., 54: 1681 (1989)CrossRefGoogle Scholar
  13. 13.
    J. Feldmann, R. Sattmann, E. Göbel, J. Nunnenkamp, J. Kuhl, J. Hebling, K. Ploog, R. Muralidharan, P. Dawson and C.T. Foxon, Sol. Stat Electr., 32: 1713 (1989)CrossRefGoogle Scholar
  14. 14.
    The values for m and n have been determined by double crystal X-ray diffractionGoogle Scholar
  15. 15.
    H.W. van Kesteren, E.C. Cosman, P. Dawson, K.J. Moore and C.T. Foxon, Phys. Rev. B, 39: 13426 (1989)CrossRefGoogle Scholar
  16. 16.
    M.S. Skolnick, G.W. Smith, I.L. Spain, C.R. Whitehouse, D.C. Herbert, D.M. Whittaker and L.J. Reed, Phys. Rev. B, 39: 11191 (1989)CrossRefGoogle Scholar
  17. 17.
    P. Dawson, C.T. Foxon and H.W. van Kesteren, Semic. Sci. Techn., 5: 54 (1990)CrossRefGoogle Scholar
  18. 18.
    J.L. Birman, M. Lax and R. Loudon, Phys. Rev., 145: 620 (1966)CrossRefGoogle Scholar
  19. 19.
    S. Adachi, J. Appl. Phys., 58: R1 (1985)CrossRefGoogle Scholar

Copyright information

© Plenum Press, New York 1991

Authors and Affiliations

  • J. Feldmann
    • 1
  • E. Göbel
    • 1
  • J. Nunnenkamp
    • 2
  • J. Kuhl
    • 2
  • K. Ploog
    • 2
  • P. Dawson
    • 3
  • C. T. Foxon
    • 3
  1. 1.Fachbereich PhysikPhilipps Universität MarburgMarburgFederal Republic of Germany
  2. 2.Max-Planck-Institut für FestkörperforschungStuttgart 80Federal Republic of Germany
  3. 3.Philips Research LaboratoriesRedhill SurreyUK

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