Abstract
We present electron microscopy studies of YBa2Cu3O7−x high temperature superconducting thin films grown by reactive evaporation, reactive sputtering and laser-ablation deposition on MgO, SrTiO3 and ZrO2 substrates at various temperatures. Combination of this work with studies of the superconducting properties of small (1μm wide) lines patterned in these films and X-ray pole figure studies has focused attention on large angle tilt boundaries found in c-axis films. Different epitaxial arrangements, corresponding grain boundaries and the grain size distributions can be generated by different choices of substrate, substrate temperature and deposition mode. Examples of grain structure, grain size distribution and high resolution studies of high angle tilt boundaries are presented. The role of the substrate in nucleating defects and grain boundaries will be reviewed. Correlation of these studies with the superconducting properties identifies high angle boundaries as a possible source of significant weakening of the critical current density. Alternatively, misoriented grains may be associated with the weak link behavior. High resolution electron microscopy permits atom structure imaging of these boundaries and, together with microanalytical work, these observations show the boundaries to be normally clean.
Keywords
- Critical Current Density
- YBCO Film
- High Resolution Electron Microscopy
- Reactive Sputtering
- Single Crystal Film
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
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References
P. Chaudhari, R. H. Koch, R. B. Laibowitz, T. R. McGuire, and R. J.Gambino, Phys. Rev. Lett. 58, 2684 (1987).
S. Jin, T. H. Tiefel, R. C. Sherwood, M. E. Davis, R. B. van Dover, G. W. Kammlott, R. A. Fastnacht, and H. D. Keith, Appl. Phys. Lett. 52, 2074 (1988).
T. L. Hylton, A. Kapitulnik, M. R. Beasley, J. P. Carini, L. Drabeck, and G. Gruner, Appl. Phys. Lett. 53, 1343 (1988).
J. W. Ekin, A. I. Braginski, A. J. Panson, M. A. Janocko, D. W. Capone II, N. J. Zaluzec, B. Flandermeyer, O. F. deLima, M. Hong, J. Kwo, and S. H. Liou, J. Appl. Phys. 62, 4821 (1987).
D. H. Shin, E. J. Kirkland, and J. Silcox, Appl. Phys. Lett. 55, 2456 (1989)
D. H. Shin, J. Silcox, S. E. Russek, D. K. Lathrop, B. Moeckly, and R. A. Buhrman, submitted for publication (1990).
S. J. Pennycook and L. A. Boatner, Nature 336, 565 (1988).
D. K. Lathrop, S. E. Russek and R. A. Buhrman, Appl. Phys. Lett. 51, 1554 (1987).
D. K. Lathrop, S. E. Russek, K. Tanabe, and R. A. Buhrman, IEEE Trans. Magn., MAG-25, 2218 (1989)
S. E. Russek, B. H. Moeckly, R. A. Buhrman, J. T. McWhirter, A. J. Sievers, M. G. Norton, L. A. Tietz, and B. Carter, presented at 1989 MRS Fall Meeting, Boston, MA (1989).
B. H. Moeckly, D. K. Lathrop, G. F. Redinbo, S. E. Russek, and R. A. Buhrman, presented at 1989 MRS Fall Meeting, Boston, MA (1989).
A. V. Crewe and J. Wall, J. Mol. Biol. 48, 375 (1970).
E. J. Kirkland, to be published, Ultramicroscopy (1990)
P. Xu, E. J. Kirkland, J. Silcox, and R. Keyse, to be published in Ultramicroscopy (1990).
R. F. Loane, E. J. Kirkland, and J. Silcox, Acta Cryst. A44, 912 (1988).
e.g., N. J. Zaluzec, “Introduction to Analytical Electron Microscopy,” eds. Joy, Hren and Goldstein, Plenum Press (1979), Chapter 4.
N. H. Fletcher, J. Appl. Phys. 35, 234 (1964).
S. J. Rothman, J. L. Routbort, and J. E. Baker, Phys. Rev. B40, 8852 (1989).
This work was supported by DARPA (Grant # 88-K-0374). The UHV-STEM was acquired through the NSF (DMR-8314255) and Cornell University, and is operated by the Cornell Material Science Center (NSF DMR-8516616).
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Shin, D.H., Silcox, J., Russek, S.E., Lathrop, D.K., Moeckly, B., Buhrman, R.A. (1990). Grain Structure and Grain Boundaries in High Tc Superconducting YBa2Cu3O7−x Thin Films. In: McConnell, R.D., Noufi, R. (eds) Science and Technology of Thin Film Superconductors 2. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-1345-8_47
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DOI: https://doi.org/10.1007/978-1-4684-1345-8_47
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