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Point Defects in Solids pp 333–392Cite as

Electron Paramagnetic Resonance of Point Defects in Solids, with Emphasis on Semiconductors

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Abstract

Electron paramagnetic resonance (EPR) has proven to be an extremely powerful tool for the study of point defects in semiconductors and insulators. As the various chapters in this and the preceding volume of this series attest, there is hardly an area of point defect study today that does not rely heavily either directly or indirectly upon EPR results for interpretation.

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Author information

Authors and Affiliations

  1. Solid State and Electronics Laboratory, General Electric Corporate Research and Development, Schenectady, New York, USA

    George D. Watkins

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  1. George D. Watkins
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Editor information

Editors and Affiliations

  1. Department of Physics, University of North Carolina, Chapel Hill, North Carolina, USA

    James H. Crawford Jr. (Chairman) & Lawrence M. Slifkin (Chairman) & 

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© 1975 Plenum Press, New York

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Watkins, G.D. (1975). Electron Paramagnetic Resonance of Point Defects in Solids, with Emphasis on Semiconductors. In: Crawford, J.H., Slifkin, L.M. (eds) Point Defects in Solids. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-0904-8_4

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  • DOI: https://doi.org/10.1007/978-1-4684-0904-8_4

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-0906-2

  • Online ISBN: 978-1-4684-0904-8

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