Abstract
Although many surface characterisation techniques are essentially broad beam methods yielding diffraction or other information averaged over large areas of surface, crucial properties of the surface may depend on steps or other inhomogeneities. There is indeed an instability, shown schematically in figure 1, whereby even a uniform single crystal overgrowth such as an expitaxial layer or adsorbed oxide tends to become inhomogeneous, forming island structures or localised defects. The overgrowth has an energy E proportional to thickness t at small t where it matches its lattice parameter with the substrate crystal at the cost of elastic strain energy (point A). At larger values of t, when elastic strain energy becomes prohibitive, misfit dislocations are introduced to relieve it. Eventually where the overgrowth has completely relaxed to its own lattice parameter, E becomes the characteristic interfacial energy of the boundary, independent of t (point C). Since the E versus t curve is concave downwards, a homogeneous film represented by point B can reduce its energy to the point D by breaking up into regions A and C.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
P.B. Hirsch, A. Howie, R.B. Nicholson, D.W. Pashley and M.J. Whelan, Electron Microscopy of Thin Crystals, Krieger, New York (1977).
B.K. Ambrose, J. Phys. E 9:382 (1976).
D. Cherns and M.J. Stowell, Thin Solid Films 29:127 (1975).
D. Cherns, Phil. Mag. 30:549 (1974).
R.L. Hines, Thin Solid Films 35:229 (1976).
J.P.F. Levitt and A. Howie, J. Microsc. 116:89 (1979).
S. Iijima, Ultramicrosc. 6:41 (1981).
A. Ourmazd, G.R. Anstis and P.B. Hirsch, Phil. Mag. A48:139 (1983).
K.N. Tu and A. Howie, Phil. Mag. 37:73 (1978).
W. Krakow, Surf. Sci. 140:137 (1984).
K. Abdelmoula, D. Renard and G. Nihoul, Ultramicrosc. 14:337 (1984).
K. Takayanagi, J. Microsc. 136:287 (1984).
K. Takayanagi, Y. Tanishiro, S. Takahashi and M. Takahashi, J. Vac. Sci. and Techn. A3:1502 (1985).
P. Morin, M. Pitaval, D. Besnard and G. Fontaine, Phil. Mag. 40:511 (1979).
P. Goodman and A. Moodie, Acta Cryst. A30:280 (1974).
A. Howie and Z.S. Basinski, Phil. Mag. 17:1039 (1968).
D.F. Lynch, Acta Cryst. A27: 399 (1971).
G. Lempfuhl and Y. Uchida. Ultramicrosc. 4:275 (1979).
R.L. Hines and A. Howie, Phil. Mag. 32:257 (1975).
P.O. Hahn and M. Henzler, J. Vac. Sci. and Tech. A2:574 (1984).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1988 Plenum Press, New York
About this chapter
Cite this chapter
Howie, A. (1988). Principles and Techniques of Transmission Imaging of Surfaces. In: Howie, A., Valdrè, U. (eds) Surface and Interface Characterization by Electron Optical Methods. NATO ASI Series, vol 16. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-9537-3_1
Download citation
DOI: https://doi.org/10.1007/978-1-4615-9537-3_1
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4615-9539-7
Online ISBN: 978-1-4615-9537-3
eBook Packages: Springer Book Archive