Abstract
The leaching process in simulated waste encapsulant glasses was studied by measuring the compositional depth-profiles of H (from water), the glass framework formers Si and B, the alkalis Na and Cs, the alkaline earths Ca and Sr, the transition metals Mo and Fe, the rare-earths La, Ce, and Nd, using the technique of sputterindiced optical emission. The leaching process of these glasses is highly complex. In addition to alkali/hydrogen exchange, there is breakdown of the glass framework, build-up of barrier layers on the surface, and formation of layered reaction zones of distinctly different chemistry all within the outer micrometer of the glass.
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© 1979 Plenum Press, New York
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Houser, C., Tsong, I.S.T., White, W.B. (1979). Characterization of Leached Surface Layers on Simulated High-Level Waste Glasses by Sputter-Induced Optical Emission. In: McCarthy, G.J., et al. Scientific Basis for Nuclear Waste Management. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-9107-8_14
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DOI: https://doi.org/10.1007/978-1-4615-9107-8_14
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4615-9109-2
Online ISBN: 978-1-4615-9107-8
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