Abstract
The past fifteen years have produced great advances in the experimental study of solid surfaces. Vacuum systems that will readily attain pressures in the 10−11 to 102212;10 torr range are commercially available. Thus, once a surface is cleaned, the researcher has adequate time to obtain information before a contaminant film can form. Accompanying these advances in obtaining low pressures in clean systems has been the development of analytic tools for examining surfaces such as LEED (low energy electron diffraction), AES (Auger emission spectroscopy), and FIM (field ion microscopy).
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Ferrante, J., Buckley, D.H., Pepper, S.V., Brainard, W.A. (1973). Use of Leed, Auger Emission Spectroscopy and Field Ion Microscopy in Microstructural Studies. In: McCall, J.L., Mueller, W.M. (eds) Microstructural Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-8693-7_10
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DOI: https://doi.org/10.1007/978-1-4615-8693-7_10
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