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Advances in Corrosion Science and Technology pp 43–113Cite as

Ellipsometry in Corrosion Technology

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Part of the book series: Advances in Corrosion Science and Technology ((ACORRST,volume 2))

Abstract

Ellipsometry is a technique for examining interfaces, in which use is made of the change in the polarization of light that occurs on reflection at an oblique angle of incidence. It may be used to determine either the optical parameters of one of the media involved, or, if an interfacial film is present, the thickness and optical properties of the layer. The attraction in applying the technique to corrosion studies is in measuring the thickness of corrosion films, and usually this can be done in situ with little or no interference to the reaction under investigation. Data on the optical properties of films may also be used as an aid in identifying film composition and, in some instances, as a powerful means of indicating differences in stoichiometry within a single-phase film. The sensitivity of the technique is of a high order, average film thicknesses being computable to within a few angstrom units, and the technique is applicable to films ranging from submonolayer thickness to many thousands of angstroms, depending in particular on the absorption coefficient of the film under study at the wavelength chosen. As a general rule, the technique can be used to measure the thickness of any films giving rise, when viewed in ordinary daylight, to interference colors.

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  1. Imperial Metals Industries, Ltd., Birmingham, England

    Peter Hayfield

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Mars G. Fontana Roger W. Staehle

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© 1972 Plenum Press, New York

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Hayfield, P. (1972). Ellipsometry in Corrosion Technology. In: Fontana, M.G., Staehle, R.W. (eds) Advances in Corrosion Science and Technology. Advances in Corrosion Science and Technology, vol 2. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-8255-7_2

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