Abstract
Second derivative energy loss spectroscopy (ELS) is a very surface sensitive technique when the incident primary electron energy, Ep, is kept around 100 eV. This is because the electron penetration depth is minimal at this energy, and also the second derivative technique is very sensitive to even minute changes in the ELS profile. Measurements similar to ours have already been made on Si(111)2Xl and Si(111)7X7 surfaces. (1–3) For low primary energies (Ep = 50–200) bulk transitions in ELS (Im 1/ε) compare well with optical absorption results (Im ε), where e is the complex dielectric function.
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© 1985 Springer Science+Business Media New York
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Avci, R., Dabbousi, O.B., Jazzar, M.S. (1985). Adsorption of Alkali Metals on Si (111) Surface. In: Chadi, J.D., Harrison, W.A. (eds) Proceedings of the 17th International Conference on the Physics of Semiconductors. Springer, New York, NY. https://doi.org/10.1007/978-1-4615-7682-2_22
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DOI: https://doi.org/10.1007/978-1-4615-7682-2_22
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