Abstract
Issues in computing I DDQ test sets are discussed. I DDQ test sets are computed using different fault models. They also differ in the source of the tests. Based on this, I DDQ test generation is classified as either: (i) direct; or (ii) indirect.
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© 1997 Springer Science+Business Media New York
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Chakravarty, S., Thadikaran, P.J. (1997). Selecting I DDQ Tests. In: Introduction to IDDQ Testing. Frontiers in Electronic Testing, vol 8. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6137-8_7
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DOI: https://doi.org/10.1007/978-1-4615-6137-8_7
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-7812-9
Online ISBN: 978-1-4615-6137-8
eBook Packages: Springer Book Archive