Abstract
Having seen the benefits of I DDQ testing we start answering the following questions which arise in the context of setting up the I DDQ test environment.
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â–ª How are I DDQ measurements made?
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â–ª How is the I DDQ threshold value, separating the good from the faulty circuit, determined?
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â–ª How many I DDQ measurements should be made? At what speed should I DDQ tests be applied?
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â–ª How do we create I DDQ test sets?
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â–ª What considerations for I DDQ testing are required during design?
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© 1997 Springer Science+Business Media New York
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Chakravarty, S., Thadikaran, P.J. (1997). Putting I DDQ Testing To Work. In: Introduction to IDDQ Testing. Frontiers in Electronic Testing, vol 8. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6137-8_3
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DOI: https://doi.org/10.1007/978-1-4615-6137-8_3
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-7812-9
Online ISBN: 978-1-4615-6137-8
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