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Single Event Phenomena II

  • George C. Messenger
  • Milton S. Ash
Chapter

Abstract

This chapter continues the discussion of the other important facets of single event phenomena. It begins with multiple event effects where one incident single event upset (SEU)-inducing ion can produce more than one bit upset in the same memory array, for example. Following the above is a discussion of the effects of a device exposed to an ionizing dose of radiation prior to and/or during the occurrence of an SEU. The ionizing dose is usually construed, but not exclusively, as that from gamma rays, X-rays, protons, or electrons, corresponding to the particular hostile or benign environment in which the device finds itself.

Keywords

Sensitive Region Memory Array Critical Charge Triple Modular Redundancy Single Event Upset 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media Dordrecht 1997

Authors and Affiliations

  • George C. Messenger
    • 1
  • Milton S. Ash
    • 2
  1. 1.Las Vegas
  2. 2.Santa Monica

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