Abstract
The penetration of particles and radiation into material is of prime importance in the determination of single event upset (SEU) and single event phenomena (SEP). This is because of the incident particle energy transfer to the device material to ionize it and thus release extraneous charge, which can ultimately be collected by memory nodes to produce SEU and other SEP.
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© 1997 Springer Science+Business Media Dordrecht
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Messenger, G.C., Ash, M.S. (1997). Particle Penetration and Energy Deposition. In: Single Event Phenomena. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6043-2_3
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DOI: https://doi.org/10.1007/978-1-4615-6043-2_3
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-412-09731-7
Online ISBN: 978-1-4615-6043-2
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