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Intersubband Transitions in Quantum Wells: Physics and Devices pp 103–109Cite as

Strain Layer Quantum Well Infrared Photodetectors(invited)

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Abstract

We present a study of several n- and p-type strain-layer quantum well infrared photodetectors (SL-QWIPs) using InxGa1-xAs/ALGa1-yAs grown on GaAs and InxGa1-xAs/InyAl1-yAs on InP substrates. The results show a significant improvement in device performance for these devices over the unstrained QWIPs. The devices studied include a high-strain (HS-) n-type InGaAs/AlGaAs/InGaAs triple-coupled (TC-) QWIP, a HS-n-type InGaAs/AlGaAs QWIP, a compressively strained layer (CSL-) p-type InGaAs/AlGaAs QWIP, and a tensile-strained layer (TSL-) p-type InGaAs/InAlAs QWIP. In addition to the improvement in performance, a large normal incidence absorption has also been observed in both the HS- n-type QWIP and TC-QWIP. The device physics and performance parameters such as the optical absorption coefficient, dark current, spectral responsivity, and detectivity for these SL-QWIPs are depicted in this paper.

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Authors and Affiliations

  1. Dept. of Electrical and Computer Engineering, University of Florida, Gainesville, FL, 32611, USA

    Sheng S. Li, J. C. Chiang, J. Chu & X. D. Jiang

  2. US Army Research Laboratory, Adelphi, MD, USA

    M. Z. Tidrow

Authors
  1. Sheng S. Li
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  2. J. C. Chiang
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  3. J. Chu
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  4. X. D. Jiang
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  5. M. Z. Tidrow
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Editors and Affiliations

  1. Dept. of Electrical and Computer Engineering, University of Florida, 32611-6130, Gainesville, FL, USA

    Sheng S. Li

  2. Dept. of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan R.O.C

    Yan-Kuin Su

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© 1998 Springer Science+Business Media New York

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Li, S.S., Chiang, J.C., Chu, J., Jiang, X.D., Tidrow, M.Z. (1998). Strain Layer Quantum Well Infrared Photodetectors(invited). In: Li, S.S., Su, YK. (eds) Intersubband Transitions in Quantum Wells: Physics and Devices. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-5759-3_15

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  • DOI: https://doi.org/10.1007/978-1-4615-5759-3_15

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-7923-8164-8

  • Online ISBN: 978-1-4615-5759-3

  • eBook Packages: Springer Book Archive

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