Abstract
A nonparametric method, which is simple and can effectively handle the system burn-in time, was introduced in Chapter 9 in situation where only a few failure times are available. The nonparametric approach can avoid the difficulties of
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• assuming any parametric form for the component’s failure mechanism,
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• estimating the parameters of the assumed parametric distributions,
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• calculating the overall system reliability, which is especially difficult when the system structure is complicated, and
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• modeling the incompatibility factor described in Chapter 7.
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© 1998 Springer Science+Business Media New York
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Kuo, W., Chien, WT.K., Kim, T. (1998). Nonparametric Bayesian Approach for Optimal Burn-in. In: Reliability, Yield, and Stress Burn-In. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-5671-8_10
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DOI: https://doi.org/10.1007/978-1-4615-5671-8_10
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-7923-8107-5
Online ISBN: 978-1-4615-5671-8
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