Abstract
The objective of delay testing is to detect timing defects and ensure that the design meets the desired performance specifications. The need for delay testing has evolved from the common problem faced by the semiconductor industry: designs that function properly at low clock frequencies fail at the rated speed. As experiments show, tests that do not specifically target delay faults have a limited success in detecting timing defects [21, 107, 108, 109, 147].
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© 1998 Springer Science+Business Media New York
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Krstić, A., Cheng, KT. (1998). Introduction. In: Delay Fault Testing for VLSI Circuits. Frontiers in Electronic Testing, vol 14. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-5597-1_1
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DOI: https://doi.org/10.1007/978-1-4615-5597-1_1
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