Abstract
The Scanning Probe Microscope (SPM), introduced in 1986, is now a common tool in many sectors of science and technology. It is a marvelous instrument with characteristics that are unsurpassed in many areas. Yet there is more to be done and we use this book to outline our vision for future instruments. We begin with a description of the essential components and emphasize those features which limit the performance and reduce the competitive edge of scanning probes.
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M. Tortonese, H. Yamada, R.C. Barret, and C.F. Quate, Proceedeings of Transducers ‘91 (IEEE, Pennington, NJ, 1991), Publication No. 91 CH2817–5, p. 488.
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© 1999 Springer Science+Business Media New York
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Minne, S.C., Manalis, S.R., Quate, C.F. (1999). Improving Conventional Scanning Probe Microscopes. In: Bringing Scanning Probe Microscopy up to Speed. Microsystems, vol 3. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-5167-6_1
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DOI: https://doi.org/10.1007/978-1-4615-5167-6_1
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-7353-7
Online ISBN: 978-1-4615-5167-6
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