CCD-Cameras for X-Ray Investigations

  • F. Fandrich
  • R. Köhler
  • F. Jenichen


In many NDT methods based on x-ray investigations the use of electronic x-ray detectors with lateral resolution (“sensor arrays“) is helpful, delivering the result immediately after measurement as digitized data. CCD camera based systems are well suited to be x-ray detectors of high quality. This contribution focuses on so-called slow-scan CCD-camera systems used for measurements with high accuracy. The general setup of CCD camera systems and the pecularities for x-ray sensitivity are explained, followed by examples of the application of CCD-cameras for double crystal x-ray topography at 8 keV with high lateral resolution and low intensities.


Lateral Resolution Image Intensifier Direct System Phosphor Screen Mechanical Shutter 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer Science+Business Media New York 1998

Authors and Affiliations

  • F. Fandrich
    • 1
    • 2
  • R. Köhler
    • 1
  • F. Jenichen
    • 3
  1. 1.Institut für Physik, Arbeitgruppe Röntgenbeugung an SchichtsystemenHumboldt-Universität BerlinBerlinGermany
  2. 2.Lehrstuhl für QualitätswesenUniversität DortmundDortmundGermany
  3. 3.Proscan GmbHPenzingGermany

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