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Nondestructive Characterization of the Thermal Diffusivity of Poor Conductors by a Low Cost, Flash Technique

  • John M. Liu
  • Robert A. Brizzolara
  • Douglas N. Rose

Abstract

Numerous techniques and approaches exist for the determination of the thermal diffusivity through the thickness of materials. These include techniques based on photothermal radiometry, the detection of the acoustic wave excited by the heating beam, and the ‘mirage’ effect. These techniques typically incorporate a high power laser or an infrared camera, items that are relative expensive and not generally available in small-scale material evaluation facilities.

Keywords

Thermal Diffusivity Front Surface Rear Surface Black Paint Poor Conductor 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Reference

  1. 1.
    W. J. Parker, et al, J. Appl. Phys. 32, 1679 (1961).CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1998

Authors and Affiliations

  • John M. Liu
    • 1
  • Robert A. Brizzolara
    • 1
  • Douglas N. Rose
    • 2
  1. 1.Carderock Div.Naval Surface Warfare CenterWest BethesdaUSA
  2. 2.AMSTA-RSAU. S. Army TACOMWarrenUSA

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